المؤلفون: Xu, Li-Tian, Zeng, Li, Zhu, Meng-Jiao, Li, Xao-Hui, Zhao, Ji-Han, Qin, Hui, Qi, Ze-Dong, Li, Yu-hao

المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-3 Mar, 2024

Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

المؤلفون: Kreethi, R., Hwang, Yu-Jin, Lee, Ho-Young, Park, Jae-Hyuk, Lee, Kee-Ahn^{Aff1, IDs43207023003322_cor5}

المصدر: Journal of the Korean Ceramic Society: 한국세라믹학회지. 61(1):63-70

المؤلفون: Seo, Hyojeong, Yang, Jeonghye, Ma, Young Jae, Park, Jongwoo, Kim, Mi Kyoung, Seo, David H., Yoon, Sung Jin, Park, Sang Jong

المصدر: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020 31st Annual. :1-5 Aug, 2020

Relation: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

المؤلفون: Saha, J.K., Ali, A., Bukke, R.N., Kim, Y.G., Islam, M.M., Jang, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(3):1063-1069 Mar, 2021

المؤلفون: Swami, H L^{Aff1, IDs12043023025790_cor1}, Mehta, V, Kumar, Yogendra, Jariwala, Chetan, Kumar, Rajesh^{Aff1, Aff2}

المصدر: Pramana: Published by the Indian Academy of Sciences. 97(3)

المؤلفون: Sébastien Raoux

المصدر: Carbon Management, Vol 14, Iss 1 (2023)

مصطلحات موضوعية: climate change, greenhouse gas emissions, net-zero, paris agreement, carbon trading, carbon offsets, monitoring, reporting, verification, mrv, greenhouse gas inventories, abatement, emissions control technologies, fluorinated compounds (fcs), f-gases, pfcs, hfcs, sf6, nf3, electronics industry, semiconductors, display, photovoltaic, Environmental sciences, GE1-350

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1758-3004; https://doaj.org/toc/1758-3012

URL الوصول: https://doaj.org/article/087224b8e5d944a7afa89ccd5965c643

المؤلفون: Park, Seran, Kim, Kyu-Dong, Oh, Hoon-Jung, Ko, Dae-Hong

المصدر: 2019 Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2019. :348-350 Mar, 2019

Relation: 2019 Electron Devices Technology and Manufacturing Conference (EDTM)

المؤلفون: Christophe Avis, Jin Jang

المصدر: Materials, Vol 16, Iss 22, p 7172 (2023)

مصطلحات موضوعية: thin-film transistor, tin oxide, oxide semiconductor, NF3 plasma treatment, crystallinity, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1996-1944/16/22/7172; https://doaj.org/toc/1996-1944

URL الوصول: https://doaj.org/article/32234ca6392d44d19ffee116e6a4476d

المؤلفون: Shim, Ho Jae, Kim, Jin Seok, Ahn, Da Won, Choe, Jin Hyun, Jung, Eunsu, Oh, Donghyuk, Kim, Kyung Soo, Lee, Sung Chul^{Aff2, IDs1339102200341z_cor8}, Pyo, Sung Gyu^{Aff1, IDs1339102200341z_cor9}

المصدر: Electronic Materials Letters. 18(3):321-329

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