المؤلفون: Buldas, A., Draheim, D., Gault, M., Laanoja, R., Nagumo, T., Saarepera, M., Shah, S.A., Simm, J., Steiner, J., Tammet, T., Truu, A.

المصدر: IEEE Access Access, IEEE. 10:77284-77322 2022

المؤلفون: Khakifirooz, A., Cheng, K., Liu, Q., Nagumo, T., Loubet, N., Reznicek, A., Kuss, J., Gimbert, J., Sreenivasan, R., Vinet, M., Grenouillet, L., Le Tiec, Y., Wacquez, R., Ren, Z., Cai, J., Shahrjerdi, D., Kulkarni, P., Ponoth, S., Luning, S., Doris, B.

المصدر: Proceedings of the IEEE 2012 Custom Integrated Circuits Conference Custom Integrated Circuits Conference (CICC), 2012 IEEE. :1-4 Sep, 2012

Relation: 2012 IEEE Custom Integrated Circuits Conference - CICC 2012

المؤلفون: Tsutsui, G., Saitoh, M., Saraya, T., Nagumo, T., Hiramoto, T.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :729-732 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Hatayama, K., Nakao, M., Kiyoshige, Y., Natsume, K., Sato, Y., Nagumo, T.

المصدر: Proceedings. International Test Conference International test conference Test Conference, 2002. Proceedings. International. :1003-1012 2002

Relation: International Test Conference

المؤلفون: Nakao, M., Kiyoshige, Y., Hatayama, K., Sato, Y., Nagumo, T.

المصدر: Proceedings 10th Asian Test Symposium Asian test symposium Test Symposium, 2001. Proceedings. 10th Asian. :244-249 2001

Relation: Tenth Asian Test Symposium

المؤلفون: Sato, Y., Ikeya, T., Nakao, M., Nagumo, T.

المصدر: Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) International test conference 2000 Test Conference, 2000. Proceedings. International. :283-291 2000

Relation: Proceedings International Test Conference 2000

المؤلفون: Khakifirooz, A., Cheng, K., Loubet, N., Nagumo, T., Reznicek, A., Liu, Q., Levin, T. M., Edge, L. F., He, H., Kuss, J., Allibert, F., Nguyen, B.-Y., Doris, B., Shahidi, G.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(11):1358-1360 Nov, 2013

المؤلفون: Ueki, M., Akeuchi, K. T., Yamamoto, T., Tanabe, A., Ikarashi, N., Saitoh, M., Nagumo, T., Sunamura, H., Narihiro, M., Uejima, K., Masuzaki, K., Furutake, N., Saito, S., Yabe, Y., Mitsuiki, A., Takeda, K., Hase, T., Hayashi, Y.

المصدر: 2015 Symposium on VLSI Circuits (VLSI Circuits) VLSI Circuits (VLSI Circuits), 2015 Symposium on. :T108-T109 Jun, 2015

Relation: 2015 Symposium on VLSI Circuits

المؤلفون: Ohtou, T., Yokoyama, K., Shimizu, K., Nagumo, T., Hiramoto, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 54(2):301-307 Feb, 2007

المؤلفون: Ohtou, T., Yokoyama, K., Nagumo, T., Hiramoto, T.

المصدر: 2005 IEEE International SOI Conference Proceedings SOI Conference SOI Conference, 2005. Proceedings. 2005 IEEE International. :101-103 2005

Relation: 2005 IEEE International SOI Conference