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المؤلفون: Teng Liu, Wen-Tong Zhang, Zhi-Li Zhang, Hua Song, Nai-Long He, Sen Zhang, Zhao-Ji Li, Bo Zhang
المصدر: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::18d3636511eccfee5ae010a423625a9f
https://doi.org/10.1109/icsict55466.2022.9963177 -
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المؤلفون: Sen Zhang, Liang Hailian, Jie Xu, Xiaofeng Gu, Yu-De Jiang, Nai-Long He
المصدر: Chinese Physics B. 30:067303
مصطلحات موضوعية: LDMOS, Materials science, Terminal (electronics), Robustness (computer science), Electronic engineering, General Physics and Astronomy, Breakdown voltage