المؤلفون: Tan, J., Lim, J.H., Kwon, J.H., Naik, V.B., Raghavan, N., Pey, K.L.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Tan, J., Lim, J.H., Sikder, B., Baten, M.Z., Kwon, J.H., Yamane, K., Naik, V.B., Raghavan, N., Pey, K.L.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(1):76-82 Jan, 2023

المؤلفون: Sivabalan, K., Yamane, K., Naik, V.B., Kwon, J.H., Ding, J., Lee, K., Yang, H.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 57(7):1-5 Jul, 2021

المؤلفون: Lim, J.H., Raghavan, N., Naik, V.B., Kwon, J.H., Yamane, K., Yang, H., Lee, K.H., Pey, K.L.

المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-7 Mar, 2019

Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Naik, V.B., Yamane, K., Lim, J.H., Lee, T.Y., Kwon, J., Aein, B., Chung, N.L., Hau, L.Y., Chao, R., Zeng, D., Otani, Y., Chiang, C., Huang, Y., Pu, L., Thiyagarajah, N., Jang, S.H., Neo, W.P., Dixit, H., Aris, S.K., Goh, L.C., Ling, T., Hwang, J., Ting, J.W., Zhang, L., Low, R., Balasankaran, N., Seet, C.S., Ong, S., Wong, J., You, Y.S., Woo, S.T., Siah, S.Y.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Lim, J.H., Raghavan, N., Padovani, A., Kwon, J.H., Yamane, K., Yang, H., Naik, V.B., Larcher, L., Lee, K.H., Pey, K.L.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :25.3.1-25.3.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Tan, J., Lim, J.H., Kwon, J.H., Naik, V.B., Raghavan, N., Pey, K.L.

المصدر: In Solid State Electronics September 2021 183

المؤلفون: Han, G., Meng, H., Huang, J., Naik, V.B., Sim, C.H., Tran, M., Lim, S.T.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 51(4):1-9 Apr, 2015

المؤلفون: Naik, V.B., Lam, M.C., Mahendiran, R.

المصدر: In Journal of Magnetism and Magnetic Materials 2010 322(18):2754-2757

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