المؤلفون: Muller, J., Pfefferling, B., Merbeth, T., Otani, Y., Hazen, D. Sanchez, Hula, T., Mansueto, M., Titova, A., Ramasubramanian, L., Grimm, C. V.-B., Weisheit, M., Wolf, G., Kriegerstein, V., Vogel, A., Scharf, P., Wang, Y., Huang, Y., Komma, V. S., Sankar, R. Uma, Yoon, H., Kallensee, O., Naik, V. B., Soss, S.

المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Ganesh Bande, Naik V. Ravinder, Ramji Banothu, Aerranagula Veerender, Babu B. Sankara, Sharma Sandeep

المصدر: E3S Web of Conferences, Vol 430, p 01153 (2023)

مصطلحات موضوعية: covid-19, predictive analytics, forecasting model, prophet algorithm, Environmental sciences, GE1-350

وصف الملف: electronic resource

Relation: https://www.e3s-conferences.org/articles/e3sconf/pdf/2023/67/e3sconf_icmpc2023_01153.pdf; https://doaj.org/toc/2267-1242

URL الوصول: https://doaj.org/article/6bf76fdcd99742ff9434e3dc43d4547a

المؤلفون: Kumar, Bura Vijay, Naik, V Ravinder, Sneha, A, Hussein, Abbas Hameed Abdul, Alzubaidi, Laith H.

المصدر: 2023 International Conference on Integrated Intelligence and Communication Systems (ICIICS) Integrated Intelligence and Communication Systems (ICIICS), 2023 International Conference on. :1-4 Nov, 2023

Relation: 2023 International Conference on Integrated Intelligence and Communication Systems (ICIICS)

المؤلفون: Soundattikar, Sujeet A., Naik, V. R., Adake, C. V.

المصدر: 2022 Second International Conference on Advances in Electrical, Computing, Communication and Sustainable Technologies (ICAECT) Advances in Electrical, Computing, Communication and Sustainable Technologies (ICAECT), 2022 Second International Conference on. :1-6 Apr, 2022

Relation: 2022 Second International Conference on Advances in Electrical, Computing, Communication and Sustainable Technologies (ICAECT)

المؤلفون: Sarkar, Tanmoy^{Aff1, IDs00468023024657_cor1}, Gowda, R. M. Bharath, Doss, S. Gandhi, Raghunath, M. K., Manjappa, Mogili, Thallapally, Naik, V. Girish, Bhuvaneswari, E., Arunakumar, G. S.

المصدر: Trees: Structure and Function. 38(1):49-64

المؤلفون: Naik, V. B., Yamane, K., Kwon, J., Lim, J.H., Balasankaran, N., Chung, N.L., Hau, L.Y., Chao, R., Chiang, C., Huang, Y., Pu, L., Ma, L., Meng, C., Otani, Y., Zhang, L., Jang, S.H., Ling, T., Ting, J.W., Yoon, H., Mueller, J., Pfefferling, B., Kallensee, O., Merbeth, T., Seet, C.S., Wong, J., You, Y.S., Soss, S., Chan, T.H., Siah, S.Y.

المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :366-368 Mar, 2022

Relation: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Jambagi, Suresh R.^{Aff1, IDs42690023010882_cor1}, Kambrekar, D. N., Mallapur, C. P., Naik, V. Rudra

المصدر: International Journal of Tropical Insect Science. 43(5):1749-1755

المؤلفون: Dhal A., Mukherjee G., Bhattacharjee M., Naik V., Mukhopadhyay S., Pandit D., Pal S., Mondal D., Karmakar P., Roy T., Asgar Md.A., Bhattacharya Soumik, Bhattacharyya S., Bhattacharya C., Banerjee S.R., Chakrabarti A.

المصدر: EPJ Web of Conferences, Vol 146, p 10013 (2017)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2100-014X

URL الوصول: https://doaj.org/article/a4b21092561844b7802fd067e5f0351a

المؤلفون: Likhitha, P.^{Aff1, IDs41938023007031_cor1}, Naik, V. Chinna Babu, Moharil, M. P., Undirwade, D. B., Kulkarni, U. S., Kolhe, A. V.

المصدر: Egyptian Journal of Biological Pest Control. 33(1)

المؤلفون: Lee, T. Y., Yamane, K., Hau, L. Y., Chao, R., Chung, N. L., Naik, V. B., Sivabalan, K., Kwon, J., Lim, J. H., Neo, W. P., Khua, K., Thiyagarajah, N., Jang, S. H., Behin-Aein, B., Toh, E. H., Otani, Y., Zeng, D., Balasankaran, N., Goh, L. C., Ling, T., Hwang, J., Zhang, L., Low, R., Tan, S. L, Seet, C. S., Ting, J. W., Ong, S., You, Y. S., Woo, S. T., Quek, E., Siah, S. Y.

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)