يعرض 1 - 10 نتائج من 198 نتيجة بحث عن '"Nakano, Yoshitaka"', وقت الاستعلام: 1.54s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Evaluation of defect density in bulk gallium nitrides by photothermal deflection spectroscopy and steady-state photocapacitance methods

    المؤلفون: Sumiya, Masatomo, Fujikura, Hajime, Nakano, Yoshitaka, Yashiro, Shuhei, Koide, Yasuo, Honda, Tohru

    المصدر: In Journal of Crystal Growth 1 June 2024 635

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  2. 2
    مؤتمر
    Deep-Level Defect Investigation of Si-Doped $\beta$-Ga2O3 Homoepitaxial Films Grown by Halide Vapor Phase Epitaxy

    المؤلفون: Nakano, Yoshitaka, Toyotome, Akira

    المصدر: 2019 Compound Semiconductor Week (CSW) Compound Semiconductor Week (CSW), 2019. :1-1 May, 2019

    Relation: 2019 Compound Semiconductor Week (CSW)

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  3. 3
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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  4. 4
    مؤتمر
    Effect of ultraviolet light-assisted CF4 plasma irradiation on AlGaN thin film surface

    المؤلفون: Kawakami, Retsuo, Niibe, Masahito, Nakano, Yoshitaka, Mukai, Takashi

    المصدر: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS), 2016. :1-1 Jun, 2016

    Relation: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)]

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  5. 5
    مؤتمر
    Electrical damage investigation of n-GaN films treated by CF4 plasma

    المؤلفون: Nakano, Yoshitaka, Niibe, Masahito, Kawakami, Retsuo

    المصدر: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS), 2016. :1-1 Jun, 2016

    Relation: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)]

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  6. 6
    دورية أكاديمية
    Visible-blind wide-dynamic-range fast-response self-powered ultraviolet photodetector based on CuI/In-Ga-Zn-O heterojunction

    المؤلفون: Yamada, Naoomi, Kondo, Yuumi, Cao, Xiang, Nakano, Yoshitaka

    المصدر: In Applied Materials Today June 2019 15:153-162

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  7. 7
    دورية أكاديمية
    Characteristics of TiO2 thin films surfaces treated by O2 plasma in dielectric barrier discharge with the assistance of external heating

    المؤلفون: Kawakami, Retsuo, Niibe, Masahito, Nakano, Yoshitaka, Araki, Yuma, Yoshitani, Yuki, Azuma, Chisato, Mukai, Takashi

    المصدر: In Vacuum June 2018 152:265-271

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  8. 8
    دورية أكاديمية
    AlGaN surfaces etched by CF4 plasma with and without the assistance of near-ultraviolet irradiation

    المؤلفون: Kawakami, Retsuo, Niibe, Masahito, Nakano, Yoshitaka, Mukai, Takashi

    المصدر: In Vacuum February 2017 136:28-35

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  9. 9
    دورية أكاديمية
    Comparison between AlGaN surfaces etched by carbon tetrafluoride and argon plasmas: Effect of the fluorine impurities incorporated in the surface

    المؤلفون: Kawakami, Retsuo, Niibe, Masahito, Nakano, Yoshitaka, Shirahama, Tatsuo, Hirai, Shodai, Mukai, Takashi

    المصدر: In Vacuum September 2015 119:264-269

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  10. 10
    دورية أكاديمية
    Damage characteristics of n-GaN thin film surfaces etched by ultraviolet light-assisted helium plasmas

    المؤلفون: Kawakami, Retsuo, Niibe, Masahito, Nakano, Yoshitaka, Shirahama, Tatsuo, Aoki, Kazuma, Oba, Kenta, Takabatake, Mari, Mukai, Takashi

    المصدر: In Thin Solid Films 3 November 2014 570 Part A:81-86

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