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1دورية أكاديمية
المؤلفون: Jun Hui Park, Jung Nam Kim, Seonhaeng Lee, Gang-Jun Kim, Namhyun Lee, Rock-Hyun Baek, Dae Hwan Kim, Changhyun Kim, Myounggon Kang, Yoon Kim
المصدر: IEEE Access, Vol 12, Pp 23881-23886 (2024)
مصطلحات موضوعية: BSIM-CMG, deep learning, genetic algorithm, I-V modeling, compact modeling, BCAT, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Hyunseo You, Kihoon Nam, Jehyun An, Chanyang Park, Donghyun Kim, Seonhaeng Lee, Namhyun Lee, Rock-Hyun Baek
المصدر: IEEE Access, Vol 12, Pp 10988-10994 (2024)
مصطلحات موضوعية: Buried-channel-array transistor (BCAT), cryogenic, drain-induced barrier lowering (DIBL), forward body bias, hot-carrier degradation, threshold voltage, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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3
المؤلفون: Sungju Choi, Ga Won Yang, Sangwon Lee, Jingyu Park, Changwook Kim, Jun Park, Hyun-Seok Choi, Namhyun Lee, Gang-Jun Kim, Yoon Kim, Myounggon Kang, Changhyun Kim, Jong-Ho Bae, Dae Hwan Kim
المصدر: IEEE Transactions on Electron Devices. 70:48-52
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4
المؤلفون: Hyunseo You, Jehyun An, Kihoon Nam, Bohyeon Kang, Jongseo Park, Namhyun Lee, Seonhaeng Lee, Rock-Hyun Baek
المصدر: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9f3000f7ca23a61b42b6c85f23f40adb
https://doi.org/10.1109/edtm55494.2023.10102979 -
5دورية أكاديمية
المؤلفون: YongHa Kang, JongKyun Kim, NamHyun Lee, MinGeon Oh, YuChul Hwang, ByungMoo Moon
المصدر: Japanese Journal of Applied Physics; Jun2016, Vol. 55 Issue 6, p1-1, 1p