-
1مؤتمر
المؤلفون: Sanghun Park, Kijong Lee, Changbum Im, Nami Kwak, Kihyun Kim, Youngdoo Choi
المصدر: Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434) ASICs ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on. :315-318 2000
Relation: Proceedings of Second IEEE Asia Pacific Conference on ASICs AP-ASIC 2000
-
2
المؤلفون: Youngdoo Choi, Nami Kwak, Kijong Lee, Sanghun Park, Kihyun Kim, Changbum Im
المصدر: Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434).
مصطلحات موضوعية: Automatic test equipment, Read-write memory, Engineering, Application-specific integrated circuit, Built-in self-test, business.industry, Embedded system, Test compression, Glue logic, Automatic test pattern generation, business, Testability, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bdc6780519f725e93065e1ccd4d8e749
https://doi.org/10.1109/apasic.2000.896971
Full Text Finder