المؤلفون: Wei, Xiyan, Xu, Xinyu, Li, Jingsong, Li, Guofeng, Zheng, Nianfeng, Wang, Zhongqing

المصدر: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2023 IEEE 6th International. :1695-1702 May, 2023

Relation: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC)

المؤلفون: Yunxiao Zhang, Yuanxiang Zhou, Chenning Yan, Hao Nie

المصدر: Energy Reports, Vol 8, Iss , Pp 541-548 (2022)

مصطلحات موضوعية: Silicone rubber, Nano doping, Thermal aging, DC breakdown voltage, Cross-linked network, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2352484722015591; https://doaj.org/toc/2352-4847

URL الوصول: https://doaj.org/article/4f2cd750f52546678cc77cd78b062b24

المؤلفون: Zhu, Ze, Sun, Huayu, Chan, Yan-cheong, Wu, Fengshun

المصدر: 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th. :1-5 Dec, 2015

Relation: 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC)

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المؤلفون: Shafiq, I., Chan, Y.C., Xu, S., Li, Q.Q.

المصدر: 18th European Microelectronics & Packaging Conference Microelectronics and Packaging Conference (EMPC), 2011 18th European. :1-7 Sep, 2011

Relation: 2011 18th European Microelectronics and Packaging Conference (EMPC)

المؤلفون: Shafiq, I., Chan, Y.C.

المصدر: 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on. :374-379 Jun, 2011

Relation: 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE)

المؤلفون: Qijun Duan, Guowei Xia, Yanze Song, Guohua Yin, Yuyao Zhong, Jun Xie, Qing Xie

المصدر: Nanomaterials, Vol 13, Iss 5, p 906 (2023)

مصطلحات موضوعية: plasma fluorination, GFRP, nano-doping, surface flashover, surface charge, trap energy levels, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-4991/13/5/906; https://doaj.org/toc/2079-4991

URL الوصول: https://doaj.org/article/1f0e79a53761414f9a2fe851d2e9a153

المؤلفون: Li, A.H., Ionescu, M., Liu, H.K., Silver, T., Wang, X.L., Dou, S.X.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 15(2):3046-3049 Jun, 2005

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