-
1مؤتمر
المؤلفون: Bhaskaran, Bonita, Banerjee, Sanmitra, Narayanun, Kaushik, Hung, Shao-Chun, Mozaffari Mojaveri, Seyed Nima, Liu, Mengyun, Chen, Gang, Liang, Tung-Che
المصدر: 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD) Computer Aided Design (ICCAD)2022 IEEE/ACM International Conference On. :1-8 Oct, 2022
Relation: 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)
-
2مؤتمر
المؤلفون: Yilmaz, Mahmut, Jagannadha, Pavan Kumar Datla, Narayanun, Kaushik, Sarangi, Shantanu, Da Silva, Francisco, Sarmiento, Joe, Tonoyan, Smbat, Chintaluri, Ashwin, Khare, Animesh, Sonawane, Milind, Kumar, Ashish, Kalva, Anitha, Hsu, Alex, Pandey, Jayesh
المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-7 Apr, 2022
Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)
-
3مؤتمر
المؤلفون: Mozaffari, Seyed Nima, Bhaskaran, Bonita, Narayanun, Kaushik, Abdollahian, Ayub, Pagalone, Vinod, Sarangi, Shantanu, Colburn, Jonathon E.
المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-10 Nov, 2019
Relation: 2019 IEEE International Test Conference (ITC)
-
4مؤتمر
المؤلفون: Li, Zipeng, Colburn, Jonathon E., Pagalone, Vinod, Narayanun, Kaushik, Chakrabarty, Krishnendu
المصدر: 2017 IEEE 35th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2017 IEEE 35th. :1-6 Apr, 2017
Relation: 2017 IEEE 35th VLSI Test Symposium (VTS)
-
5مؤتمر
المؤلفون: Wang, Ran, Bhaskaran, Bonita, Natarajan, Karthikeyan, Abdollahian, Ayub, Narayanun, Kaushik, Chakrabarty, Krishnendu, Sanghani, Amit
المصدر: 2016 IEEE 34th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2016 IEEE 34th. :1-6 Apr, 2016
Relation: 2016 IEEE 34th VLSI Test Symposium (VTS)
-
6مؤتمر
المصدر: 2016 IEEE 34th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2016 IEEE 34th. :1-6 Apr, 2016
Relation: 2016 IEEE 34th VLSI Test Symposium (VTS)
-
7دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
8
المؤلفون: Narayanun, Kaushik
المصدر: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)مصطلحات موضوعية: Programmable architectures, Integrated circuits, Microelectrònica, Spintronics, Espintrònica, DFT, ML, Enginyeria electrònica::Microelectrònica [Àrees temàtiques de la UPC], Microelectronics, High-data volume, Design quality, AI, High-speed interfaces, RMA, Circuits integrats, DFD, EDA, Portability of test
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::06ee825a56328c7e83c1819fb8c3a99e
https://hdl.handle.net/2117/372174