المؤلفون: Ueki, M., Hayashi, Y., Furutake, N., Masuzaki, K., Tanabe, A., Narihiro, M., Sunamura, H., Uejima, K., Mitsuiki, A., Takeda, K., Hase, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(2):419-426 Feb, 2017

المؤلفون: Abe, M., Tada, M., Ohtake, H., Furutake, N., Narihiro, M., Arai, K., Takeuchi, T., Saito, S., Taiji, T., Motoyama, K., Kasama, Y., Arita, K., Ito, F., Yamamoto, H., Tagami, M., Tonegawa, T., Tsuchiya, Y., Fujii, K., Oda, N., Sekine, M., Hayashi, Y.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :77-80 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Wakabayashi, H., Ueki, M., Narihiro, M., Fukai, T., Ikezawa, N., Matsuda, T., Yoshida, K., Takeuchi, K., Ochiai, Y., Mogami, T., Kunio, T.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :49-52 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Ueki, M., Tada, M., Tagami, M., Narihiro, M., Ito, F., Hayashi, Y.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 11(1):98-105 Mar, 2011

المؤلفون: Hayashi, Y., Abe, M., Tada, M., Narihiro, M., Tagami, M., Ueki, M., Inoue, N., Ito, F., Yamamoto, H., Takeuchi, T., Saito, S., Onodera, T., Furutake, N.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 56(8):1579-1587 Aug, 2009

المؤلفون: Ueki, M., Akeuchi, K. T., Yamamoto, T., Tanabe, A., Ikarashi, N., Saitoh, M., Nagumo, T., Sunamura, H., Narihiro, M., Uejima, K., Masuzaki, K., Furutake, N., Saito, S., Yabe, Y., Mitsuiki, A., Takeda, K., Hase, T., Hayashi, Y.

المصدر: 2015 Symposium on VLSI Circuits (VLSI Circuits) VLSI Circuits (VLSI Circuits), 2015 Symposium on. :T108-T109 Jun, 2015

Relation: 2015 Symposium on VLSI Circuits

المؤلفون: Tada, M., Ohtake, H., Ito, F., Narihiro, M., Taiji, T., Kasama, Y., Takeuchi, T., Arai, K., Furutake, N, Oda, N., Sekine, M., Hayashi, Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 54(4):797-806 Apr, 2007

المؤلفون: Fujii, T., Mazaki, H., Takei, F., Bae, J., Narihiro, M., Noda, T., Sakaki, H., Mizuno, K.

المصدر: 1996 IEEE MTT-S International Microwave Symposium Digest Microwave symposium Microwave Symposium Digest, 1996., IEEE MTT-S International. 2:919-922 vol.2 1996

Relation: 1996 IEEE MTT-S International Microwave Symposium Digest

المؤلفون: Wakabayashi, H., Ezaki, T., Sakamoto, T., Kawaura, H., Ikarashi, N., Ikezawa, N., Narihiro, M., Ochiai, Y., Ikezawa, T., Takeuchi, K., Yamamoto, T., Hane, M., Mogami, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(9):1961-1970 Sep, 2006

المؤلفون: Tada, M., Tamura, T., Ito, F., Ohtake, H., Narihiro, M., Tagami, M., Ueki, M., Hijioka, K., Abe, M., Inoue, N., Takeuchi, T., Saito, S., Onodera, T., Furutake, N., Arai, K., Sekine, M., Suzuki, M., Hayashi, Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(5):1169-1179 May, 2006