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المؤلفون: Nathan D. Hindman, Dan W. Patterson, Satendra Kumar Maurya, Lawrence T. Clark, Keith E. Holbert, S. M. Guertin
المصدر: IEEE Transactions on Nuclear Science. 58:3018-3025
مصطلحات موضوعية: Nuclear and High Energy Physics, Sequential logic, Computer science, Pipeline (computing), Register file, Hardware_PERFORMANCEANDRELIABILITY, Microarchitecture, law.invention, Microprocessor, Soft error, Nuclear Energy and Engineering, CMOS, law, Electronic engineering, Electrical and Electronic Engineering, Error detection and correction
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2
المصدر: IEEE Transactions on Nuclear Science. 58:3046-3052
مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, Sequential logic, Diode–transistor logic, Pass transistor logic, business.industry, Logic family, Hardware_PERFORMANCEANDRELIABILITY, Logic synthesis, Nuclear Energy and Engineering, Logic gate, Electronic engineering, Electrical and Electronic Engineering, business, Computer hardware, Hardware_LOGICDESIGN, Asynchronous circuit, Logic optimization
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3
المصدر: IEEE Transactions on Nuclear Science. 57:258-265
مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit design, Upset, law.invention, Threshold voltage, Design for manufacturability, Nuclear Energy and Engineering, law, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, business, Radiation hardening, Voltage
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المؤلفون: Lawrence T. Clark, W.M. Shedd, Xiaoyin Yao, Keith E. Holbert, D.R. Alexander, Nathan D. Hindman
المصدر: IEEE Transactions on Nuclear Science. 55:3280-3287
مصطلحات موضوعية: Very-large-scale integration, Nuclear and High Energy Physics, Moore's law, Engineering, Hardware_MEMORYSTRUCTURES, business.industry, media_common.quotation_subject, Memory bank, Nuclear Energy and Engineering, Absorbed dose, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, business, Radiation hardening, NMOS logic, media_common, Leakage (electronics)
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المؤلفون: David R. Allee, Ziyan Wang, Nathan D. Hindman, Lawrence T. Clark
المصدر: IEEE Transactions on Nuclear Science. 54:2073-2079
مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, Comparator, Transistor, Integrated circuit, Noise (electronics), law.invention, Nuclear Energy and Engineering, CMOS, law, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Comparators circuits, Electrical and Electronic Engineering, Radiation hardening, Voltage
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المؤلفون: Lawrence T. Clark, Srivatsan Chella, Thomas J. Mozdzen, Keith E. Holbert, Nathan D. Hindman, Sandeep Shambhulingaiah
المصدر: 2011 12th European Conference on Radiation and Its Effects on Components and Systems.
مصطلحات موضوعية: Digital electronics, Engineering, Sequential logic, business.industry, Master/slave, Hardware_PERFORMANCEANDRELIABILITY, law.invention, Logic synthesis, Single event upset, law, Low-power electronics, Logic gate, Electronic engineering, business, Flip-flop, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b25e02cb9a14a737984a47531a6cca3a
https://doi.org/10.1109/radecs.2011.6131300 -
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المصدر: ISCAS
مصطلحات موضوعية: Very-large-scale integration, Standard cell, Logic synthesis, Materials science, Absorbed dose, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Ring oscillator, Multiplexing, Hardware_LOGICDESIGN, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::669c4c143ac337cded84292f22f395eb
https://doi.org/10.1109/iscas.2011.5938000 -
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المؤلفون: Yu Cao, Nathan D. Hindman, Srivatsan Chellappa, Jia Ni, Min Chen, Jyothi Velamala, Xiaoyin Yao, Lawrence T. Clark
المصدر: DAC
مصطلحات موضوعية: Engineering, Computational complexity theory, business.industry, Numerical analysis, Transistor, Chip, law.invention, Threshold voltage, Data retention voltage, law, Electronic engineering, Static random-access memory, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2fb1eb76b4f1a426159b6c2a4a7b9b6f
https://doi.org/10.1145/1837274.1837454 -
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المؤلفون: Xiaoyin Yao, Dan W. Patterson, Lawrence T. Clark, David E. Pettit, Keith E. Holbert, Kyle E. Nielsen, Nathan D. Hindman
المصدر: 2009 European Conference on Radiation and Its Effects on Components and Systems.
مصطلحات موضوعية: Engineering, business.industry, Clock gating, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, law.invention, CMOS, law, Single event upset, Low-power electronics, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_ARITHMETICANDLOGICSTRUCTURES, Standby power, business, Hardware_LOGICDESIGN, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5615ef73f0862a7b53fdb04fcdaa9ad7
https://doi.org/10.1109/radecs.2009.5994697