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المؤلفون: Thomas Rodgers, Allen Gu, Greg Johnson, Masako Terada, Nathaniel Cohan, Vignesh Viswanathan, Michael W. Phaneuf, Joachim de Fourestier, Ethan Ruttan, Stewart McCracken, Suzanne Costello, Aidan M Robinson, Andrew Gibson, Alan Balfour
المصدر: International Symposium for Testing and Failure Analysis.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::246ad1832d1e1a2111d958a60c06d720
https://doi.org/10.31399/asm.cp.istfa2022p0319