المؤلفون: NEVES, N. S.

المصدر: Trends in Computational and Applied Mathematics. January 2022 23(1)

مصطلحات موضوعية: elementos finitos, teoria de campo escalar, programa computacional, física-matemática

وصف الملف: text/html

URL الوصول: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2676-00292022000100117

المؤلفون: Beeren, I. A. O., Dos Santos, G.^{Aff1, Aff2, Aff3}, Dijkstra, P. J., Mota, C., Bauer, J., Ferreira, H.^{Aff2, Aff3}, Reis, Rui L.^{Aff2, Aff3}, Neves, N.^{Aff2, Aff3}, Camarero-Espinosa, S.^{Aff1, Aff4, Aff5}, Baker, M. B., Moroni, L.^{Aff1, IDs42242024002862_cor11}

المصدر: Bio-Design and Manufacturing. 7(3):277-291

المؤلفون: Moura, M. M. M. S., Napoleão, D. C., Lima, M. V., Melo, A. M. M. A., Neves, N. S. C. S., Duarte, M. M. M. B.^{Aff1, IDs43153023003221_cor6}

المصدر: Brazilian Journal of Chemical Engineering. 41(1):309-323

المؤلفون: Neves, N., Domingos, J.M., Roma, N., Tomas, P., Falcao, G.

المصدر: IEEE Micro Micro, IEEE. 42(5):49-58 Jan, 2022

المؤلفون: Medeiros, I., Neves, N., Correia, M.

المصدر: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 71(2):1033-1056 Jun, 2022

المؤلفون: Crespo, L., Tomas, P., Roma, N., Neves, N.

المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 69(5):2478-2482 May, 2022

المؤلفون: Mendes, R., Oliveira, T., Cogo, V., Neves, N., Bessani, A.

المصدر: IEEE Transactions on Cloud Computing IEEE Trans. Cloud Comput. Cloud Computing, IEEE Transactions on. 9(4):1349-1361 Jan, 2021

المؤلفون: Neves, N., Tomas, P., Roma, N.

المصدر: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 70(3):483-494 Mar, 2021

المؤلفون: Medeiros, I., Beatriz, M., Neves, N., Correia, M.

المصدر: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 68(3):1168-1188 Sep, 2019

المؤلفون: Melo, W.S., Bessani, A., Neves, N., Santin, A.O., Carmo, L.F.R.C.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 68(5):1503-1514 May, 2019