المؤلفون: Zoubir Khatir, Son-Ha Tran, Ali Ibrahim, Richard Lallemand, Nicolas Degrenne

المصدر: Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)

مصطلحات موضوعية: Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/5321eb1bf0a3412dbb3da87d8718420b

المؤلفون: Briac Baudais, Hamid Ben Ahmed, Gurvan Jodin, Nicolas Degrenne, Stéphane Lefebvre

المصدر: Energies, Vol 16, Iss 5, p 2192 (2023)

مصطلحات موضوعية: power electronics, inverter, life cycle assessment, environmental impacts, eco-design, Technology

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1996-1073/16/5/2192; https://doaj.org/toc/1996-1073

URL الوصول: https://doaj.org/article/c2af5f1242a5425e872263fa4f24bdc3

المؤلفون: Nicolas Degrenne, Romain Delamea, Stefan Mollov

المصدر: AIMS Electronics and Electrical Engineering, Vol 4, Iss 2, Pp 154-168 (2020)

مصطلحات موضوعية: health monitoring, igbt power module, power cycling, temperature estimation, wire-bond degradation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://www.aimspress.com/article/10.3934/ElectrEng.2020.2.154/fulltext.html; https://doaj.org/toc/2578-1588

URL الوصول: https://doaj.org/article/96e90415c14a4a3689f2aa009188bc46

المؤلفون: Nicolas, Degrenne, Guillaume, Lefevre, Stefan, Mollov

المصدر: 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe) Power Electronics and Applications (EPE'16 ECCE Europe), 2016 18th European Conference on. :1-10 Sep, 2016

Relation: 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe)

المؤلفون: Guillaume, Lefevre, Nicolas, Degrenne, Stefan, Mollov

المصدر: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on. :1-10 Sep, 2015

Relation: 2015 17th European Conference on Power Electronics and Applications (EPE '15 ECCE Europe)

المؤلفون: Louis Schuler, Ludovic Chamoin, Zoubir Khatir, Mounira Berkani, Merouane Ouhab, Nicolas Degrenne

المصدر: Computational Mechanics. 70:407-424

مصطلحات موضوعية: Computational Mathematics, Computational Theory and Mathematics, Applied Mathematics, Mechanical Engineering, Computational Mechanics, Ocean Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::84164d36f24fe01e309ea7d02d355ad7
https://doi.org/10.1007/s00466-022-02173-y

المؤلفون: Louis Schuler, Ludovic Chamoin, Zoubir Khatir, Mounira Berkani, Merouane Ouhab, Nicolas Degrenne

المصدر: Journal of Electronic Packaging. 144

مصطلحات موضوعية: Mechanics of Materials, Electrical and Electronic Engineering, Computer Science Applications, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1a547325e79b05ad8d5d7a5e7df4dada
https://doi.org/10.1115/1.4053767

المؤلفون: Son-Ha Tran, Richard Lallemand, Ali Ibrahim, Nicolas Degrenne, Zoubir Khatir

المساهمون: Technologies pour une Electro-Mobilité Avancée (SATIE-TEMA), Composants et Systèmes pour l'Energie Electrique (CSEE), Systèmes et Applications des Technologies de l'Information et de l'Energie (SATIE), École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-Systèmes et Applications des Technologies de l'Information et de l'Energie (SATIE), École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY), Mitsubishi Electric R&D Centre Europe [France] (MERCE-France), Mitsubishi Electric [France]

المصدر: Scientific Reports
Scientific Reports, Nature Publishing Group, 2021, 11, pp.5601. ⟨10.1038/s41598-021-84976-2⟩
Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)

مصطلحات موضوعية: Science, Acceleration (differential geometry), 02 engineering and technology, 01 natural sciences, Article, POWER CYCLING, DUREE DE VIE, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, 010302 applied physics, Physics, Sequence, Multidisciplinary, 020208 electrical & electronic engineering, Mathematical analysis, Bipolar junction transistor, Swing, Electrical and electronic engineering, Mechanical engineering, VIEILLISSEMENT, [SPI.TRON]Engineering Sciences [physics]/Electronics, MINER RULE, Power module, Power cycling, Medicine, Junction temperature, Stress conditions, SEMICONDUCTOR POWER ELECTRONICS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6b237a884aaa97cf1c0a40c1cf809b44
https://pubmed.ncbi.nlm.nih.gov/33692407

المؤلفون: Stefan Mollov, R. Delamea, Nicolas Degrenne

المصدر: 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe).

مصطلحات موضوعية: Wire bonding, Materials science, business.product_category, 020209 energy, 020208 electrical & electronic engineering, Condition monitoring, Mechanical engineering, 02 engineering and technology, Insulated-gate bipolar transistor, Chip, Reliability (semiconductor), Power module, 0202 electrical engineering, electronic engineering, information engineering, Die (manufacturing), business, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ccc45fa567b7b18bf1e8b6f6e8452d22
https://doi.org/10.23919/epe20ecceeurope43536.2020.9215944

المؤلفون: Nicolas Degrenne, Zoubir Khatir, Stefan Mollov, Damien Ingrosso, Ali Ibrahim, Nausicaa Dornic

المساهمون: Technologies pour une Electro-Mobilité Avancée (SATIE-TEMA), Composants et Systèmes pour l'Energie Electrique (CSEE), Systèmes et Applications des Technologies de l'Information et de l'Energie (SATIE), École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-Systèmes et Applications des Technologies de l'Information et de l'Energie (SATIE), École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY)-École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY), Mitsubishi Electric Centre Europ, parent, École normale supérieure - Rennes (ENS Rennes)-Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Ecole Normale Supérieure Paris-Saclay (ENS Paris Saclay)-Université Gustave Eiffel-CY Cergy Paris Université (CY), Mitsubishi Electric [France]

المصدر: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2020, 114, 7p. ⟨10.1016/j.microrel.2020.113873⟩
Microelectronics Reliability, Elsevier, 2020, 114, pp.113873. ⟨10.1016/j.microrel.2020.113873⟩

مصطلحات موضوعية: Wire bonding, Materials science, chemistry.chemical_element, 02 engineering and technology, 01 natural sciences, IGBT, Aluminium, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, BONDWIRE DEGRADATION, Power semiconductor device, Electrical and Electronic Engineering, Composite material, Safety, Risk, Reliability and Quality, ComputingMilieux_MISCELLANEOUS, 010302 applied physics, POWER ELECTRONICS, 020208 electrical & electronic engineering, [SPI.NRJ]Engineering Sciences [physics]/Electric power, Insulated-gate bipolar transistor, Condensed Matter Physics, Microstructure, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, VIEILLISSEMENT, [SPI.TRON]Engineering Sciences [physics]/Electronics, chemistry, Power module, Power cycling, Electron backscatter diffraction

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::18caf42364a94183b01b667d936c39de
https://hal.archives-ouvertes.fr/hal-03147217