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1مؤتمر
المؤلفون: Shirley, C. Glenn, Daasch, W. Robert, Nigh, Phil, Conroy, Zoe
المصدر: 2014 International Test Conference Test Conference (ITC), 2014 IEEE International. :1-8 Oct, 2014
Relation: 2014 IEEE International Test Conference (ITC)
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2مؤتمر
المؤلفون: Grady, Matt, Pepper, Bradley, Patch, Joshua, Degregorio, Michael, Nigh, Phil
المصدر: 2013 IEEE International Test Conference (ITC) Test Conference (ITC), 2013 IEEE International. :1-8 Sep, 2013
Relation: 2013 IEEE International Test Conference (ITC)
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3مؤتمرHow are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond?
المؤلفون: Nigh, Phil
المصدر: 2012 IEEE International Test Conference Test Conference (ITC), 2012 IEEE International. :1-4 Nov, 2012
Relation: 2012 IEEE International Test Conference (ITC)
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4مؤتمر
المؤلفون: Gattiker, Anne, Nigh, Phil
المصدر: 2011 IEEE International Test Conference Test Conference (ITC), 2011 IEEE International. :1-6 Sep, 2011
Relation: 2011 IEEE International Test Conference (ITC)
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5مؤتمر
المؤلفون: Nigh, Phil
المصدر: 2016 21th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2016 21th IEEE European. :1-1 May, 2016
Relation: 2016 IEEE European Test Symposium (ETS)
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6مؤتمر
المؤلفون: Lin, Yen-Tzu, Poku, Osei, Blanton, R. D., Nigh, Phil, Lloyd, Peter, Iyengar, Vikram
المصدر: 2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-9 Oct, 2008
Relation: 2008 IEEE International Test Conference (ITC)
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7مؤتمر
المؤلفون: Nigh, Phil
المصدر: 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on. :3-3 Oct, 2008
Relation: 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS)
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8مؤتمر
المصدر: 26th IEEE VLSI Test Symposium (vts 2008) VLSI Test Symposium, 2008. VTS 2008. 26th IEEE. :23-28 Apr, 2008
Relation: 26th IEEE VLSI Test Symposium
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9مؤتمر
المؤلفون: Nigh, Phil
المصدر: 2011 IEEE International Test Conference Test Conference (ITC), 2011 IEEE International. :1-1 Sep, 2011
Relation: 2011 IEEE International Test Conference (ITC)
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