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المؤلفون: Noe Pion, Gabriela Csurka, Yohann Cabon, Torsten Sattler, Martin Humenberger
المصدر: 3DV
2020 International Conference on 3D Vision (3DV)مصطلحات موضوعية: FOS: Computer and information sciences, 0209 industrial biotechnology, Computer Science - Machine Learning, Landmark, Computer science, business.industry, Computer Vision and Pattern Recognition (cs.CV), Computer Science - Computer Vision and Pattern Recognition, Context (language use), 02 engineering and technology, Machine Learning (cs.LG), Visualization, 020901 industrial engineering & automation, Robustness (computer science), 0202 electrical engineering, electronic engineering, information engineering, Benchmark (computing), 020201 artificial intelligence & image processing, Computer vision, Augmented reality, Artificial intelligence, business, Image retrieval, Pose