يعرض 1 - 10 نتائج من 207 نتيجة بحث عن '"Nolhier, N."', وقت الاستعلام: 0.90s تنقيح النتائج
  1. 1
    مؤتمر
    Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level

    المؤلفون: Boyer, A., Nolhier, N., Caignet, F., Dhia, S. Ben

    المصدر: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe Electromagnetic Compatibility – EMC Europe, 2022 International Symposium on. :120-125 Sep, 2022

    Relation: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe

    Full Text Finder
    أضف إلى المفضلة
  2. 2
    دورية أكاديمية
    On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II

    المؤلفون: Boyer, A., Nolhier, N., Caignet, F., Dhia, S.B.

    المصدر: IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 64(5):1493-1505 Oct, 2022

    Full Text Finder
    أضف إلى المفضلة
  3. 3
    مؤتمر
    Anticipating Common-Mode Conducted Emission of DC-DC Converter from Electric Near-Field Scan

    المؤلفون: Boyer, A., Nolhier, N., Caignet, F., Dhia, S. Ben

    المصدر: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium EMC/SI/PI and EMC Europe Symposium, 2021 IEEE International Joint. :603-608 Jul, 2021

    Relation: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium

    أضف إلى المفضلة
  4. 4
    دورية أكاديمية
    Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model From TLP Measurement

    المؤلفون: Escudie, F., Caignet, F., Nolhier, N., Boyer, A.

    المصدر: IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 64(1):47-57 Feb, 2022

    Full Text Finder
    أضف إلى المفضلة
  5. 5
    دورية أكاديمية
    Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes

    المؤلفون: Boyer, A., Nolhier, N., Caignet, F., Dhia, S.B.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-15 2021

    Full Text Finder
    أضف إلى المفضلة
  6. 6
    مؤتمر
    A 3U cubesat to investigate erbium doped fiber degradation at low earth orbit

    المؤلفون: Fernandez, A., Llopis, O., Nolhier, N., Viallon, C., Rissons, A., Destic, F., Lizy-Destrez, S.

    المصدر: 2016 IEEE Avionics and Vehicle Fiber-Optics and Photonics Conference (AVFOP) Avionics and Vehicle Fiber-Optics and Photonics Conference (AVFOP), 2016 IEEE. :1-3 Oct, 2016

    Relation: 2016 IEEE Avionics and Vehicle Fiber-Optics and Photonics Conference (AVFOP)

    Full Text Finder
    أضف إلى المفضلة
  7. 7
    مؤتمر
    Novel 3D back-to-back diodes ESD protection

    المؤلفون: Courivaud, B., Nolhier, N., Ferru, G., Bafleur, M., Caignet, F.

    المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th. :1-8 Sep, 2014

    Relation: 2014 36th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

    Full Text Finder
    أضف إلى المفضلة
  8. 8
    مؤتمر
    20GHz on-chip measurement of ESD waveform for system level analysis

    المؤلفون: Caignet, F., Nolhier, N., Wang, A., Mauran, N.

    المصدر: 2013 35th Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th. :1-9 Sep, 2013

    Relation: 2013 35th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

    Full Text Finder
    أضف إلى المفضلة
  9. 9
    مؤتمر
    Behavioral-modeling methodology to predict Electrostatic-Discharge susceptibility failures at system level: An IBIS improvement

    المؤلفون: Monnereau, N., Caignet, F., Nolhier, N., Tremouilles, D., Bafleur, M.

    المصدر: 10th International Symposium on Electromagnetic Compatibility EMC Europe 2011 York. :457-463 Sep, 2011

    Relation: 2011 International Symposium on Electromagnetic Compatibility - EMC EUROPE

    Full Text Finder
    أضف إلى المفضلة
  10. 10
    مؤتمر
    ESD system level characterization and modeling methods applied to a LIN transceiver

    المؤلفون: Besse, P., Lafon, F., Monnereau, N., Caignet, F., Laine, J. P., Salles, A., Rigour, S., Bafleur, M., Nolhier, N., Tremouilles, D.

    المصدر: EOS/ESD Symposium Proceedings Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd. :1-9 Sep, 2011

    Relation: 2011 33rd Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

    Full Text Finder
    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء