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1مؤتمر
المؤلفون: Takuya Futatsuyama, Norihiro Fujita, Naoya Tokiwa, Yoshihiko Shindo, Toshiaki Edahiro, Teruhiko Kamei, Hiroaki Nasu, Makoto Iwai, Koji Kato, Yasuyuki Fukuda, Naoaki Kanagawa, Naofumi Abiko, Masahide Matsumoto, Toshihiko Himeno, Toshifumi Hashimoto, Yi-Ching Liu, Chibvongodze, Hardwell, Takamitsu Hori, Manabu Sakai, Hong Ding, Yoshiaki Takeuchi, Hitoshi Shiga, Norifumi Kajimura, Yasuyuki Kajitani, Kiyofumi Sakurai, Kosuke Yanagidaira, Toshihiro Suzuki, Yuko Namiki, Tomofumi Fujimura, Man Mui, Hao Nguyen, Lee, Seungpil, Mak, Alex, Lutze, Jeffery, Tooru Maruyama, Toshiharu Watanabe, Takahiko Hara, Shigeo Ohshima
المصدر: 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International. :242-243 Feb, 2009
Relation: 2009 IEEE International Solid-State Circuits Conference - (ISSCC)
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المؤلفون: Hao Nguyen, Tomofumi Fujimura, Yasuyuki Kajitani, Alex Mak, Seungpil Lee, T. Watanabe, Norihiro Fujita, Yuko Namiki, Hardwell Chibvongodze, H. Nasu, Toshihiko Himeno, Toshihiro Suzuki, Takuya Futatsuyama, Yoshiaki Takeuchi, Kosuke Yanagidaira, Naofumi Abiko, Yi-Ching Liu, Toshifumi Hashimoto, Makoto Iwai, Teruhiko Kamei, Yoshihiko Shindo, Koji Kato, T. Maruyama, Man Mui, Hitoshi Shiga, Naoya Tokiwa, Takamitsu Hori, Masahide Matsumoto, Yasuyuki Fukuda, Shigeo Ohshima, Naoaki Kanagawa, Toshiaki Edahiro, Kiyofumi Sakurai, Norifumi Kajimura, Hong Ding, Manabu Sakai, Takahiko Hara, Jeffery Lutze
المصدر: ISSCC
مصطلحات موضوعية: Flash (photography), Hardware_MEMORYSTRUCTURES, Computer science, Nand flash memory, business.industry, Logic gate, NAND gate, business, Flash memory, Computer hardware
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0771b48639664a8880fce803382e3c13
https://doi.org/10.1109/isscc.2009.4977398 -
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المؤلفون: Norifumi Kajimura, H. Otake, F. Ito, Kazushige Kanda, Y. Okukawa, Teruhiko Kamei, Mitsuhiro Noguchi, M. Higashitani, M. Kojima, Masahiro Yoshihara, Kazuhide Yoneya, Frank Tsai, Masanobu Shirakawa, M. Itoh, Siu Lung Chan, Toshiki Hisada, Yosuke Kato, Takashi Taira, Eiichi Makino, Binh Quang Le, Dai Nakamura, G. Hemink, Toshio Yamamura, Alex Mak, Shinji Miyamoto, Raul-Adrian Cernea, Yoshinao Suzuki, Shigeo Ohshima, Susumu Fujimura, Koji Hosono, Toru Miwa, Yoshiaki Takeuchi, T. Maruyama, T. Arizono, Toshitake Yaegashi, Masaru Koyanagi, K. Ino
المصدر: ISSCC
مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Nand flash memory, % area reduction, NAND gate, CMOS, Hardware_GENERAL, Charge trap flash, business, Computer hardware, Gate equivalent, Leakage (electronics), Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9da534784a76ae16b8a2968acd297f0f
https://doi.org/10.1109/isscc.2008.4523241