المؤلفون: Takenaga, T., Yoshida, C., Yamazaki, Y., Hatada, A., Nakabayashi, M., Iba, Y., Takahashi, A., Noshiro, H., Tsunoda, K., Aoki, M., Furukawa, T., Ohji, H., Sugii, T.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 49(7):3878-3881 Jul, 2013

المؤلفون: Yoshida, C., Takenaga, T., Iba, Y., Yamazaki, Y., Noshiro, H., Tsunoda, K., Hatada, A., Nakabayashi, M., Takahashi, A., Aoki, M., Sugii, T.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 49(7):4363-4366 Jul, 2013

المؤلفون: Terada, S., Murakami, H., Nishihagi, K., Noshiro, H., Horii, Y.

المصدر: 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295) Semiconductor manufacturing 99 Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI. :414-419 1999

Relation: 1999 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings

المؤلفون: Sato, Y., Tsunoda, K., Kinoshita, K., Noshiro, H., Aoki, M., Sugiyama, Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(5):1185-1191 May, 2008

المؤلفون: Yamazaki, T., Inoue, K.-i., Miyazawa, H., Nakamura, M., Sashida, N., Satomi, R., Kerry, A., Katoh, Y., Noshiro, H., Takai, K., Shinohara, R., Ohno, C., Nakajima, T., Furumura, Y., Kawamura, S.

المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :613-616 1997

Relation: International Electron Devices Meeting. IEDM Technical Digest

المؤلفون: Yoshida, C., Takenaga, T., Yamazaki, Y., Uehara, H., Noshiro, H., Tsunoda, K., Iba, Y., Hatada, A., Nakabayashi, M., Takahashi, A., Aoki, M., Sugii, T.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 50(11):1-4 Nov, 2014

المؤلفون: Tsunoda, K., Kinoshita, K., Noshiro, H., Yamazaki, Y., Iizuka, T., Ito, Y., Takahashi, A., Okano, A., Sato, Y., Fukano, T., Aoki, M., Sugiyama, Y.

المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :767-770 Dec, 2007

Relation: 2007 IEEE International Electron Devices Meeting

المؤلفون: Kinoshita, K., Tsunoda, K., Sato, Y., Noshiro, H., Yamazaki, Y., Fukano, T., Yagaki, S., Aoki, M., Sugiyama, Y.

المصدر: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop Non-Volatile Semiconductor Memory Workshop, 2007 22nd IEEE. :66-67 Aug, 2007

Relation: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop

المؤلفون: Yoshida, C., Noshiro, H., Yamazaki, Y., Iizuka, T., Stoh, Y., Aoki, M., Umehara, S., Satoh, M., Kobayashi, K.

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :697-698 Mar, 2006

Relation: 2006 IEEE International Reliability Physics Symposium Proceedings

المؤلفون: Tsunoda, K., Aoki, M., Noshiro, H., Iba, Y., Fukuda, S., Yoshida, C., Yamazaki, Y., Takahashi, A., Hatada, A., Nakabayashi, M., Tsuzaki, Y., Sugii, T.

المصدر: 2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :19.3.1-19.3.4 Dec, 2014

Relation: 2014 IEEE International Electron Devices Meeting (IEDM)