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مصطلحات موضوعية: Geology, QE1-996.5, Stratigraphy, QE640-699

وصف الملف: electronic resource

Relation: https://gchron.copernicus.org/articles/6/247/2024/gchron-6-247-2024.pdf; https://doaj.org/toc/2628-3697; https://doaj.org/toc/2628-3719

URL الوصول: https://doaj.org/article/9b94ff620174429a88d3cc63cb5012a8

المؤلفون: Rivera Velazquez, J.M., Latorre, L., Mailly, F., Nouet, P.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(15):15410-15418 Aug, 2022

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المصدر: 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) FDTC Fault Detection and Tolerance in Cryptography (FDTC), 2021 Workshop on. :67-73 Sep, 2021

Relation: 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)

المؤلفون: Toulemont, J., Mailly, F., Maurine, P., Nouet, P.

المصدر: 2021 19th IEEE International New Circuits and Systems Conference (NEWCAS) New Circuits and Systems Conference (NEWCAS), 2021 19th IEEE International. :1-4 Jun, 2021

Relation: 2021 19th IEEE International New Circuits and Systems Conference (NEWCAS)

المؤلفون: Abdellatif, S., Mezghani, B., Mailly, F., Nouet, P.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(2):1199-1208 Jan, 2022

المؤلفون: Garradhi, Karima^{Aff1, IDs1047002302163x_cor1}, Nouet, Pascal, Hassen, Néjib

المصدر: Analog Integrated Circuits and Signal Processing: An International Journal. 115(3):319-334

المؤلفون: Abdellatif, S., Mezghani, B., Tounisi, F., Mailly, F., Nouet, P.

المصدر: 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2018 25th IEEE International Conference on. :301-304 Dec, 2018

Relation: 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

المؤلفون: Tahoori, M., Nair, S. M., Bishnoi, R., Senni, S., Mohdad, J., Mailly, F., Torres, L., Benoit, P., Gamatie, A., Nouet, P., Ouattara, F., Sassatelli, G., Jabeur, K., Vanhauwaert, P., Atitoaie, A., Firastrau, I., Di Pendina, G., Prenat, G.

المصدر: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018. :931-936 Mar, 2018

Relation: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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المؤلفون: Talaat, Maichael^{Aff1, Aff2}, Shotar, Eimad, Premat, Kévin, Boch, Anne-Laure, Delaitre, Mariette, Borius, Pierre-Yves, Nouet, Aurelien, Lenck, Stéphanie, Talbi, Atika, Bessar, Awad, Taema, Mohammed, Bessar, Ahmed, Hassan, Farouk, Elserafy, Tamer S., Lefevre, Etienne, Degos, Vincent^{Aff7, Aff8}, Sourour, Nader, Clarençon, Frédéric^{Aff1, Aff8, IDs00062022011769_cor18}

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