المؤلفون: Cacho, F., Federspiel, X., Nouguier, D., Diouf, C.

المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019

Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Cacho, F., Nouguier, D., Arabi, M., Federspiel, X., Carminati, Y., Saliva, M.

المصدر: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) On-Line Testing And Robust System Design (IOLTS), 2018 IEEE 24th International Symposium on. :1-5 Jul, 2018

Relation: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

المؤلفون: Fenouillet-Beranger, C., Beaurepaire, S., Deprat, F., de Sousa, A. Ayres, Brunet, L., Batude, P., Rozeau, O., Andrieu, F., Besombes, P., Samson, M-P., Previtali, B., Nemouchi, F., Rodriguez, G., Rodriguez, P., Famulok, R., Rambal, N., Balan, V., Saghi, Z., Jousseaume, V., Guerin, C., Ibars, F., Proud, F., Nouguier, D., Ney, D., Delaye, V., Dansas, H., Federspiel, X., Vinet, M.

المصدر: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :252-255 Sep, 2017

Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Beaurepaire, S., Jousseaume, V., Gonon, P., Bsiesy, A., Guerin, C., Rochat, N., Licitra, C., Charvet, P-L., Veillerot, M., Rambal, N., Nouguier, D., Ney, D., Federspiel, X., Fenouillet-Beranger, C.

المصدر: 2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :61-63 Jun, 2018

Relation: 2018 IEEE International Interconnect Technology Conference (IITC)

المؤلفون: Nouguier, D., Ndiaye, C., Ghibaudo, G., Federspiel, X., Rafik, M., Roy, D.

المصدر: 2016 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2016 IEEE International. :83-86 2016

Relation: 2016 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Nouguier, D., Rafik, M., Federspiel, X., Ghibaudo, G.

المصدر: 2015 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2015 IEEE International. :87-90 Oct, 2015

Relation: 2015 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Lu, C.-M. V., Deprat, F., Fenouillet-Beranger, C., Batude, P., Garros, X., Tsiara, A., Leroux, C., Gassilloud, R., Nouguier, D., Ney, D., Federspiel, X., Besombes, P., Toffoli, A., Romano, G., Rambal, N., Delaye, V., Barge, D., Samson, M.-P., Previtali, B., Tabone, C., Pasini, L., Brunet, L., Andrieu, F., Micoud, J., Skotnicki, T., Vinet, M.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T226-T227 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Federspiel, X., Nouguier, D., Ney, D., Ya, T.

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :DG-9.1-DG-9.4 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Nouguier, D., Ghibaudo, G., Federspiel, X., Rafik, M., Roy, D.

المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2016 IEEE International. :XT-08-1-XT-08-6 Apr, 2016

Relation: 2016 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Nouguier, D., Ghibaudo, G., Federspiel, X., Rafik, M., Roy, D.

المصدر: In Microelectronics Reliability July 2019 98:119-123