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1مؤتمر
المؤلفون: Pavlin, M., Novak, F.
المصدر: 2015 38th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) Information and Communication Technology, Electronics and Microelectronics (MIPRO), 2015 38th International Convention on. :390-392 May, 2015
Relation: 2015 38th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)
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2مؤتمر
المؤلفون: Keymeulen, D., Zebulum, R., Rajeshuni, R., Stoica, A., Katkoori, S., Graves, S., Novak, F., Antill, C.
المصدر: First NASA/ESA Conference on Adaptive Hardware and Systems (AHS'06) Adaptive Hardware and Systems, 2006. AHS 2006. First NASA/ESA Conference on. :296-300 2006
Relation: First NASA/ESA Conference on Adaptive Hardware and Systems
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3مؤتمر
المصدر: Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European. :133-138 2004
Relation: Proceedings Ninth IEEE European Test Symposium
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4مؤتمر
المؤلفون: Yuan Chen, Guertin, S.M., Petkov, M., Nguyen, D.N., Novak, F.
المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :435-439 2004
Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings
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5مؤتمر
المؤلفون: Sedevcic, R., Kac, U., Novak, F., Biasizzo, A.
المصدر: First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings. Testability Assessment Testability Assessment, 2004. IWoTA 2004. Proceedings. First International Workshop on. :26-32 2004
Relation: Proceedings. 1st International Workshop on Testability Assessment
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6مؤتمر
المؤلفون: Flottes, M.-L., Bertrand, Y., Balado, L., Lupon, E., Biasizzo, A., Novak, F., Di Carlo, S., Prinetto, P., Pricopi, N., Wunderlich, H.-J.
المصدر: Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications Electronic design, test and applications Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on. :135-139 2004
Relation: Second IEEE International Workshop on Electronic Design, Test and Applications
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7مؤتمر
المؤلفون: Scheick, L., Novak, F.
المصدر: Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on. :471-478 2003
Relation: Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.
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8دورية أكاديمية
المؤلفون: Legat, U., Biasizzo, A., Novak, F.
المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 59(5):2562-2571 Oct, 2012
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9مؤتمر
المؤلفون: Kac, U., Novak, F., Macek, S., Zarnik, M.S.
المصدر: Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) Design automation and test in Europe Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings. :463-467 2000
Relation: Proceedings of Meeting on Design Automation and Test in Europe
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10مؤتمر
المصدر: Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) Design, automation and test in Europe Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings. :249-253 1999
Relation: Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings