المؤلفون: Mannaa, S., Poittevin, A., Marchand, C., Deleruyelle, D., Deveautour, B., Bosio, A., O'Connor, I., Mukherjee, C., Wang, Y., Rezgui, H., Deng, M., Maneux, C., Muller, J., Pelloquin, S., Moustakas, K., Larrieu, G.

المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits IEEE J. Explor. Solid-State Comput. Devices Circuits Exploratory Solid-State Computational Devices and Circuits, IEEE Journal on. 9(2):116-123 Dec, 2023

المؤلفون: O'Connor, I., Wille, R., Pimentel, A.D., Bertacco, V.

المصدر: IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 40(5):104-112 Oct, 2023

المؤلفون: Marchand, C., O'Connor, I., Cantan, M., Breyer, E.T., Slesazeck, S., Mikolajick, T.

المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits IEEE J. Explor. Solid-State Comput. Devices Circuits Exploratory Solid-State Computational Devices and Circuits, IEEE Journal on. 8(1):19-26 Jun, 2022

المؤلفون: O'Connor, I., Poittevin, A., Le Beux, S., Bosio, A., Stanojevic, Z., Baumgartner, O., Mukherjee, C., Maneux, C., Trommer, J., Mikolajick, T., Larrieu, G.

المصدر: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) Ultimate Integration on Silicon (EuroSOI-ULIS), 2021 Joint International EUROSOI Workshop and International Conference on. :1-4 Sep, 2021

Relation: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

المؤلفون: Marchand, C., O'Connor, I., Cantan, M., Breyer, E.T., Slesazeck, S., Mikolajick, T.

المصدر: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2021 16th International Conference on. :1-6 Jun, 2021

Relation: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

المؤلفون: Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., Di Natale, G., Anghel, L., Nagarajan, S., R. Fieback, M. C., Hamdioui, S.

المصدر: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019 IEEE International Symposium on. :8138-8143 Oct, 2019

Relation: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Perodou, A., Korniienko, A., Scorletti, G., Zarudniev, M., David, J., O'Connor, I.

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 68(1):161-174 Jan, 2021

المؤلفون: Fummi, F., O'Connor, I.

المصدر: IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 38(4):128-130 Aug, 2021

المؤلفون: Perodou, A., Korniienko, A., Scorletti, G., O'Connor, I.

المصدر: 2018 Conference on Design of Circuits and Integrated Systems (DCIS) Design of Circuits and Integrated Systems (DCIS), 2018 Conference on. :1-6 Nov, 2018

Relation: 2018 Conference on Design of Circuits and Integrated Systems (DCIS)

المؤلفون: Luo, J., Pham, V.-D., Killian, C., Chillet, D., O'Connor, I., Sentieys, O., Le Beux, S.

المصدر: 2018 Conference on Design of Circuits and Integrated Systems (DCIS) Design of Circuits and Integrated Systems (DCIS), 2018 Conference on. :1-6 Nov, 2018

Relation: 2018 Conference on Design of Circuits and Integrated Systems (DCIS)