نتائج البحث - "O. Flament"

1

Large SET Duration Broadening in a Fully-Depleted SOI Technology—Mitigation With Body Contacts

المؤلفون: Daisuke Kobayashi, O. Flament, Dale McMorrow, Hirokazu Ikeda, Veronique Ferlet-Cavrois, Kazuyuki Hirose, J.R. Schwank, M. Gaillardin

المصدر: IEEE Transactions on Nuclear Science. 57:1811-1819

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Transistor, Silicon on insulator, law.invention, Threshold voltage, Nuclear Energy and Engineering, law, Logic gate, Optoelectronics, Body region, Transient response, Transient (oscillation), Electrical and Electronic Engineering, business, NOR gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9be5bd36ede0cd96d0c44e17d7d9c338
https://doi.org/10.1109/tns.2010.2048927

2

Effect of the Ion Mass and Energy on the Response of 70-nm SOI Transistors to the Ion Deposited Charge by Direct Ionization

المؤلفون: O. Flament, Arnaud Bournel, Melanie Raine, J.-E. Sauvestre, V. Aubry-Fortuna, Marc Gaillardin

المصدر: IEEE Transactions on Nuclear Science. 57:1892-1899

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Doping, Transistor, Silicon on insulator, chemistry.chemical_element, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Ion, law.invention, Xenon, Nuclear Energy and Engineering, chemistry, law, Ionization, MOSFET, Electrical and Electronic Engineering, Atomic physics, Nucleon

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::748f4a08059ed49b024190079360981d
https://doi.org/10.1109/tns.2010.2048926

3

Analysis of Quasi-Monoenergetic Neutron and Proton SEU Cross Sections for Terrestrial Applications

المؤلفون: Damien Lambert, P. Paillet, Thierry Carriere, J. Baggio, Frédéric Saigné, B. Sagnes, Sylvain Girard, V. Ferlet-Cavrois, N. Buard, Guillaume Hubert, O. Flament, Jerome Boch

المساهمون: Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS), ONERA - The French Aerospace Lab [Toulouse], ONERA, DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), EADS, Corporate Research Center, EADS Paris

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2006, 53 (4), pp.1890-1896. ⟨10.1109/TNS.2006.880935⟩
IEEE Transactions on Nuclear Science, 2006, 53 (4), pp.1890-1896. ⟨10.1109/TNS.2006.880935⟩

مصطلحات موضوعية: Nuclear and High Energy Physics, 010504 meteorology & atmospheric sciences, Proton, Astrophysics::High Energy Astrophysical Phenomena, Nuclear Theory, soft error rate (SER), Bulk technologies, 7. Clean energy, 01 natural sciences, Nuclear physics, Cross section (physics), 0103 physical sciences, Neutron cross section, single-event upset (SEU), Neutron, Electrical and Electronic Engineering, Nuclear Experiment, 0105 earth and related environmental sciences, Bonner sphere, Physics, Range (particle radiation), 010308 nuclear & particles physics, [SPI.TRON]Engineering Sciences [physics]/Electronics, Soft error, Nuclear Energy and Engineering, Single event upset, neutron and proton effects

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2964dd635574f59dd1053e6ec936ecfd
https://doi.org/10.1109/tns.2006.880935

4

Monte-Carlo simulations of ion track in silicon and influence of its spatial distribution on single event effects

المؤلفون: Alain L'Hoir, O. Flament, T. Colladant, Je Sauvestre

المساهمون: Institut des Nanosciences de Paris (INSP), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2006, 245 (2), pp.464-474. ⟨10.1016/j.nimb.2005.11.144⟩