لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Michael Schroter, Didier Celi, O. Saxod, V.T. Vu, Pascal Chevalier, T. Rosenbaum, Cristell Maneux

المصدر: 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM.

مصطلحات موضوعية: Materials science, business.industry, Transconductance, Transistor, Reference data (financial markets), Space charge, law.invention, law, Calibration, Miniaturization, Electronic engineering, Optoelectronics, Microelectronics, business, Sheet resistance

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5b6937de6f5aeb8df889180f880fae1c
https://doi.org/10.1109/bctm.2015.7340550

المؤلفون: Pascal Chevalier, Didier Celi, O. Saxod, Thomas Zimmer, V.T. Vu, T. Rosenbaum, Sebastien Fregonese

المساهمون: fregonese, sebastien, STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)

المصدر: Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 2015 IEEE
Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 2015 IEEE, Oct 2015, Boston, United States

مصطلحات موضوعية: 010302 applied physics, Materials science, Fabrication, [SPI] Engineering Sciences [physics], Heterojunction bipolar transistor, Doping, 01 natural sciences, Engineering physics, Capacitance, Silicon-germanium, [SPI]Engineering Sciences [physics], chemistry.chemical_compound, CMOS, chemistry, 0103 physical sciences, Thermal, Electronic engineering, ComputingMilieux_MISCELLANEOUS, Sheet resistance

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b35a7463a310a9acaf75c7c6d8eab2bd
https://doi.org/10.1109/bctm.2015.7340558

المؤلفون: S. Joblot, C. De-Buttet, Sébastien Petitdidier, F. Abbate, C. Jenny, Didier Celi, B. Ramadout, Thomas Quemerais, Sebastien Haendler, Laurent Favennec, Daniel Gloria, O. Robin, C. Richard, E. Canderle, B. Borot, K. Haxaire, N. Derrier, Remi Beneyton, Julien Rosa, G. Ribes, O. Saxod, P. Brun, Y. Campidelli, Pascal Chevalier, Cedric Durand, A. Montagne, Francois Leverd, G. Imbert, Olivier Gourhant, M. Guillermet, E. Gourvest, L. Berthier, Clement Tavernier, J. Cossalter, M. Buczko, C. Deglise, Mickael Gros-Jean, C. Julien, Jean-Damien Chapon, K. Courouble, D. Ney, G. Avenier, Patrick Maury, Y. Carminati, R. Bianchini, F. Foussadier

المصدر: 2014 IEEE International Electron Devices Meeting.

مصطلحات موضوعية: Bit cell, Materials science, business.industry, Heterojunction bipolar transistor, Electrical engineering, Ring oscillator, BiCMOS, Inductor, law.invention, Capacitor, CMOS, law, Extremely high frequency, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1a267063e241381b03eefae310424668
https://doi.org/10.1109/iedm.2014.7046978

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Gareth Roy, A. Juge, O. Saxod, Xingsheng Wang, Asen Asenov, A. Bajolet

المصدر: IEEE Electron Device Letters. 33:643-645

مصطلحات موضوعية: Materials science, CMOS, Logic gate, MOSFET, Semiconductor device modeling, Electronic engineering, Granularity, Electrical and Electronic Engineering, Metal gate, Standard deviation, Electronic, Optical and Magnetic Materials, Computational physics, Threshold voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::303f23a8bd61b21325dd50e197683a7a
https://doi.org/10.1109/led.2012.2188268

المؤلفون: D. Barge, Gerard Ghibaudo, C. Leroux, D. Pellissier-Tanon, F. Abbate, Denis Rideau, G. Bidal, Clement Tavernier, O. Saxod, G. Reimbold, Alain Toffoli, A. Soussou, G. Romano

المساهمون: Institut des Matériaux Jean Rouxel (IMN), Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST), Université de Nantes (UN)-Université de Nantes (UN)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Polytechnique de l'Université de Nantes (EPUN), Université de Nantes (UN)-Université de Nantes (UN), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)

المصدر: Microelectronic Engineering
Microelectronic Engineering, Elsevier, 2013, 109, pp.282-285. ⟨10.1016/j.mee.2013.03.008⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Gate stack, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Dipole, 0103 physical sciences, Optoelectronics, Work function, Flat band, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4a250045984f0f0de0160a27ad361368
https://hal.archives-ouvertes.fr/hal-00996510

المؤلفون: Herve Jaouen, Denis Rideau, Antoine Cros, O. Saxod, O. Nier, Ben Akkez, Sebastien Haendler, Frederic Monsieur, Clement Tavernier

المصدر: Extended Abstracts of the 2012 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Materials science, Coulomb, Nanotechnology, Back bias, Limited mobility, Engineering physics, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cff7611ed0172c5f4b2daf9b0c49f78c
https://doi.org/10.7567/ssdm.2012.e-9-1

المؤلفون: Denis Rideau, V. Quenette, Erwan Dornel, O. Saxod, M. Weybright, J. P. Manceau, Davide Garetto, Clement Tavernier, Herve Jaouen

المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS).

مصطلحات موضوعية: Materials science, business.industry, Logic gate, Electric field, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, High voltage, Hardware_PERFORMANCEANDRELIABILITY, Electric potential, business, Quantum tunnelling, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d9a90222de0b3d41fd24a646992e9f4
https://doi.org/10.1109/icmts.2010.5466816

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.