يعرض 1 - 10 نتائج من 60 نتيجة بحث عن '"OIML"', وقت الاستعلام: 1.01s تنقيح النتائج
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    دورية أكاديمية
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    مؤتمر

    المصدر: 2021 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2021 IEEE International Workshop on. :103-108 Jul, 2021

    Relation: 2021 IEEE International Workshop on Metrology for Automotive (MetroAutomotive)

  3. 3
    كتاب إلكتروني

    المؤلفون: Srikkanth, G. R.Aff6, Zafer, Afaqul, Section editorAff7, Agarwal, Ashutosh, Section editorAff8, Yadav, Sanjay, Section editorAff9

    المساهمون: Aswal, Dinesh K., editorAff1, Yadav, Sanjay, editorAff2, Takatsuji, Toshiyuki, editorAff3, Rachakonda, Prem, editorAff4, Kumar, Harish, editorAff5

    المصدر: Handbook of Metrology and Applications. :2031-2051

    Degree: M.Tech
    PhD

  4. 4
    مؤتمر

    المصدر: 2018 2nd IEEE Advanced Information Management,Communicates,Electronic and Automation Control Conference (IMCEC) Advanced Information Management,Communicates,Electronic and Automation Control Conference (IMCEC), 2018 2nd IEEE. :492-496 May, 2018

    Relation: 2018 2nd IEEE Advanced Information Management,Communicates,Electronic and Automation Control Conference (IMCEC)

  5. 5
    مؤتمر

    المصدر: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) Precision Electromagnetic Measurements (CPEM 2018), 2018 Conference on. :1-2 Jul, 2018

    Relation: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)

  6. 6
  7. 7
  8. 8
    كتاب إلكتروني

    المؤلفون: Bulska, EwaAff11

    المساهمون: Carpenter, Barry, Series EditorAff1, Ceroni, Paola, Series EditorAff2, Kirchner, Barbara, Series EditorAff3, Landfester, Katharina, Series EditorAff4, Leszczynski, Jerzy, Series EditorAff5, Luh, Tien-Yau, Series EditorAff6, Perlt, Eva, Series EditorAff7, Polfer, Nicolas C., Series EditorAff8, Salzer, Reiner, Series EditorAff9, Bulska, EwaAff10

    المصدر: Metrology in Chemistry. 101:13-22

  9. 9
    دورية أكاديمية
  10. 10
    دورية أكاديمية