يعرض 1 - 10 نتائج من 531 نتيجة بحث عن '"ON-state resistance"', وقت الاستعلام: 0.83s تنقيح النتائج
  1. 1
    مؤتمر
    Design and Development of p-GaN Gate HEMT with Schottky Source Extension for Improved Short-Circuit Reliability

    المؤلفون: Yu, Jingjing, Yang, Junjie, Wu, Yanlin, Li, Teng, Cui, Jiawei, Shen, Bo, Zhang, Meng, Wang, Maojun, Wei, Jin

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :263-266 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  2. 2
    مؤتمر
    A Fully Realised ‘Dielectric Field Relief’ TrenchMOS Technology

    المؤلفون: Siddiqui, MD Imran, Peake, Steven T., Hsu, Wesley Chih-Wei, Kim, Hungjin, Havaldar, Dnyanesh, Gilmartin, Stephen, Culshaw, Ian

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :363-366 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  3. 3
    مؤتمر
    An On-State Resistance Monitoring Method of T-type Three-Level Inverters

    المؤلفون: Zhao, Qi, Zhang, Min, Shen, Ke, Zhao, Dan

    المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :4359-4363 May, 2024

    Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)

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  4. 4
    دورية أكاديمية
    Challenges and Implementation of Online In Situ RDSON Measurement in a Three-Phase Inverter

    المؤلفون: Roy, C., Kim, N., Evans, D., Gafford, J., Parkhideh, B.

    المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 39(9):11677-11686 Sep, 2024

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  5. 5
    دورية أكاديمية
    Dynamic On-Resistance and Threshold Voltage Instability Evaluation Circuit for Power GaN HEMTs Devices

    المؤلفون: Kumar, R., Wu, T.

    المصدر: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 71(9):11706-11709 Sep, 2024

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  6. 6
    دورية أكاديمية
    Low ON-Resistance and High Peak Voltage Transmission Efficiency Based on High-Purity 4H-SiC Photoconductive Semiconductor Switch

    المؤلفون: Sun, X., Xiao, L., Luan, C., Feng, Z., Sha, H., Li, Y., Jiao, J., Qin, Y., Chen, X., Li, H., Xu, X.

    المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 39(2):2013-2019 Feb, 2024

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  7. 7
    مؤتمر
    H-Bridge-based Experimental Setup for GaN HEMTs' Thermal Cycling Testing

    المؤلفون: Sayed, Hussain, Krishnamoorthy, Harish Sarma

    المصدر: 2023 IEEE International Conference on Power Electronics, Smart Grid, and Renewable Energy (PESGRE) Power Electronics, Smart Grid, and Renewable Energy (PESGRE), 2023 IEEE International Conference on. :1-6 Dec, 2023

    Relation: 2023 IEEE International Conference on Power Electronics, Smart Grid, and Renewable Energy (PESGRE)

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  8. 8
    دورية أكاديمية
    Noise-Robust Online Measurement of the On-State Resistance of the Power Semiconductor Devices in PWM Converters

    المؤلفون: Shin, J., Kim, W.

    المصدر: IEEE Access Access, IEEE. 12:63669-63682 2024

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  9. 9
    دورية أكاديمية
    A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions

    المؤلفون: Asoodar, M., Nahalparvari, M., Schneider, S., Shafikhani, I., Ingestrom, G., Nee, H.

    المصدر: IEEE Open Journal of Instrumentation and Measurement IEEE Open J. Instrum. Meas. Instrumentation and Measurement, IEEE Open Journal of. 3:1-13 2024

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  10. 10
    دورية أكاديمية
    Switched-Resistance Method for Inductor DCR and Switch Parameter Estimation of DC-DC Converter

    المؤلفون: Biswas, K., Chakraborty, R., Ray, O., Boppu, S.

    المصدر: IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 60(1):783-794 Jan, 2024

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