المؤلفون: Mizushima, Ayako, Misumi, Kei, Yasunaga, Shun, Higo, Akio, Nakane, Ryosho, Tsumura, Kazumichi, Higashi, Kazuyuki, Ochiai, Yukinori, Mita, Yoshio

المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-4 Apr, 2024

Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Yasunaga, Shun, Misumi, Kei, Mizushima, Ayako, Toyokura, Atsushi, Ota, Etsuko, Inoue, Yurie, Fujiwara, Makoto, Kawai, Noriko, Yoda, Mitsuhiro, Tsuboi, Shinji, Sawamura, Tomoki, Higo, Akio, Nakane, Ryosho, Ochiai, Yukinori, Mita, Yoshio

المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-4 Apr, 2024

Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Yasunaga, Shun, Ezawa, Motohiko, Tsuji, Keigo, Misumi, Kei, Sawamura, Tomoki, Tsuboi, Shinji, Mizushima, Ayako, Ochiai, Yukinori, Higo, Akio, Mita, Yoshio

المصدر: 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers) Solid-State Sensors, Actuators and Microsystems (Transducers), 2023 22nd International Conference on. :453-456 Jun, 2023

Relation: 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)

المؤلفون: Mita, Yoshio, Ezawa, Motohiko, Tsuji, Keigo, Lebrasseur, Eric, Sawamura, Tomoki, Tsuboi, Shinji, Mizushima, Ayako, Ochiai, Yukinori, Higo, Akio

المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-4 Mar, 2022

Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Ebihara, Yusuke, Mizushima, Ayako, Yoda, Takashi, Hirakawa, Kenji, Iwase, Masayuki, Ogasawara, Munehiro, Higo, Akio, Ochiai, Yukinori, Mita, Yoshio

المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-5 Mar, 2022

Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Higo, Akio, Ochiai, Yukinori, Mita, Yoshio

المصدر: 2021 21st International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers) SSolid-State Sensors, Actuators and Microsystems (Transducers), 2021 21st International Conference on. :1048-1051 Jun, 2021

Relation: 2021 21st International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)

المؤلفون: Matsui, Shinji^Aff4, Ochiai, Yukinori^Aff4, Baba, Masakazu^Aff4, Watanabe, Heiji^Aff4

المساهمون: Gentili, M., editor^Aff1, Giovannella, C., editor^Aff2, Selci, S., editor^Aff3

المصدر: NANOLITHOGRAPHY: A Borderland between STM, EB, IB, and X-Ray Lithographies. 264:25-43

المؤلفون: Matsui, Shinji^Aff4, Ichihashi, Toshinori^Aff4, Ochiai, Yukinori^Aff4, Baba, Masakazu^Aff4, Watanabe, Heiji^Aff4, Sato, Akinobu^Aff4

المساهمون: Namba, Susumu, editor^Aff1, Hamaguchi, Chihiro, editor^Aff2, Ando, Tsuneya, editor^Aff3

المصدر: Science and Technology of Mesoscopic Structures. :334-352

المؤلفون: Kometani, Reo, Funabiki, Ryoko, Hoshino, Takayuki, Kanda, Kazuhiro, Haruyama, Yuichi, Kaito, Takashi, Fujita, Jun-ichi, Ochiai, Yukinori, Matsui, Shinji

المصدر: In Microelectronic Engineering 2006 83(4):1642-1645

المؤلفون: Igaki, Jun-ya, Kanda, Kazuhiro, Haruyama, Yuichi, Ishida, Masahiko, Ochiai, Yukinori, Fujita, Jun-ichi, Kaito, Takashi, Matsui, Shinji

المصدر: In Microelectronic Engineering 2006 83(4):1225-1228