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1مؤتمرMoisture Influence on Reliability and Electrical Characteristics of SiOC:H Low-k Dielectric Material
المؤلفون: Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Pelissier, Bernard, Fornara, Pascal, Escales, Jean-Philippe, Potard, Pascale, Moragues, Jean-Michel, Ogier, Jean-Luc
المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-4 Oct, 2019
Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)
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2مؤتمر
المؤلفون: Morillon, Dann, Masson, Pascal, Julien, Franck, Lorenzini, Philippe, Goy, Jerome, Pribat, Clement, Gourhant, Olivier, Kempf, Thibault, Ogier, Jean-Luc, Villaret, Alexandre, Ghezzi, Giada, Cherault, Nathalie, Niel, Stephan
المصدر: 2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-4 Oct, 2018
Relation: 2018 International Integrated Reliability Workshop (IIRW)
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3مؤتمر
المؤلفون: Morillon, Dann, Pribat, Clement, Julien, Franck, Cherault, Nathalie, Goy, Jerome, Gourhant, Olivier, Ogier, Jean-Luc, Masson, Pascal, Ghezzi, Giada, Kempf, Thibault, Delalleau, Julien, Villaret, Alexandre, Grenier, Jean-Christophe, Niel, Stephan
المصدر: 2017 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2017 IEEE International. :1-4 Oct, 2017
Relation: 2017 IEEE International Integrated Reliability Workshop (IIRW)
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4مؤتمر
المؤلفون: Marca, Vincenzo Della, Amouroux, Julien, Delalleau, Julien, Lopez, Laurent, Ogier, Jean-Luc, Postel-Pellerin, Jeremy, Lalande, Frederic, Molas, Gabriel
المصدر: CAS 2011 Proceedings (2011 International Semiconductor Conference) Semiconductor Conference (CAS), 2011 International. 2:339-342 Oct, 2011
Relation: 2011 International Semiconductor Conference (CAS 2011)
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5مؤتمر
المؤلفون: Benard, Christelle, Ogier, Jean-Luc, Goguenheim, Didier
المصدر: 2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :12-15 Oct, 2008
Relation: 2008 IEEE International Integrated Reliability Workshop Final Report (IRW)
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6مؤتمر
المؤلفون: Math, Gaetan, Benard, Christelle, Ogier, Jean-Luc, Goguenheim, Didier
المصدر: 2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :60-63 Oct, 2008
Relation: 2008 IEEE International Integrated Reliability Workshop Final Report (IRW)
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7مؤتمر
المؤلفون: Benard, Christelle, Ogier, Jean-Luc, Goguenheim, Didier
المصدر: 2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :7-11 Oct, 2008
Relation: 2008 IEEE International Integrated Reliability Workshop Final Report (IRW)
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8دورية أكاديمية
المؤلفون: Torrente, Giulio, Coignus, Jean, Vernhet, Alexandre, Ogier, Jean-Luc, Roy, David, Ghibaudo, Gérard
المصدر: In Microelectronics Reliability December 2017 79:281-287
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9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.
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