المؤلفون: Tae, Yong-Gyoung, An, Ha-Young, Jin, Justin, Song, Suk-Chan, Oh, Ghil-Geun

المصدر: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-4 Jul, 2023

Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Oh, Ghil-Geun, Ho, Min-Hye, Shin, Yeon-Jung, Choi, Jae-Wook, Kim, Ju-Youn, Kim, Young-Dae

المصدر: 2021 IEEE Asian Solid-State Circuits Conference (A-SSCC) Solid-State Circuits Conference (A-SSCC), 2021 IEEE Asian. :1-3 Nov, 2021

Relation: 2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Ahn, Sang-Uck, Seo, Beom-Kyu, Kim, Hyun-Woo, Shin, Yeoun-Sook, Kim, Hyung-Tae, Oh, Ghil-Geun, Kim, Young-Dae

المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-4 Nov, 2020

Relation: 2020 IEEE International Test Conference (ITC)

المؤلفون: Oh, Ghil-Geun, Kim, Si-Jeong, Jin, Kyeong-Ju, Jung, Shin- Young, Lee, Brandon

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Oh, Ghil-Geun, Eun, Jong-Ho, Chung, Shin-Young, Lee, Brandon

المصدر: 2019 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2019 International. :44-45 Oct, 2019

Relation: 2019 International SoC Design Conference (ISOCC)

المؤلفون: Sung, Ba-Ro-Saim, Lee, Chang-Kyo, Kim, Wan, Kim, Jong-In, Hong, Hyeok-Ki, Oh, Ghil-Geun, Lee, Choong-Hoon, Choi, Michael, Park, Ho-Jin, Ryu, Seung-Tak

المصدر: 2013 IEEE Asian Solid-State Circuits Conference (A-SSCC) Solid-State Circuits Conference (A-SSCC), 2013 IEEE Asian. :281-284 Nov, 2013

Relation: 2013 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Oh, Ghil-Geun, Ryu, Seung-Tak

المصدر: 2014 IEEE International Conference on Electron Devices and Solid-State Circuits Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on. :1-2 Jun, 2014

Relation: 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

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تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Kim, Jung-Tae, Seo, Nam-Sik, Oh, Ghil-Geun, Kim, Dae-Gue, Lee, Kyu-Taek, Choi, Chi-Young, Kim, InSoo, Min, Hyoung Bok

المصدر: Proceedings of SPIE; Nov2008 Part 2, Issue 1, p72681H-72681H-9, 9p