المؤلفون: Usami, M., Sato, A., Tanabe, H., Iwamatsu, T., Maegawa, S., Ohji, Y.

المصدر: 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International. :1191-1200 2006

Relation: 2006 IEEE International Solid State Circuits Conference

المؤلفون: Sonoda, K., Narumi, S., Tanizawa, M., Ishikawa, K., Eimori, T., Ohji, Y., Kurata, H.

المصدر: 2005 International Conference On Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on. :123-126 2005

Relation: 2005 International Conference On Simulation of Semiconductor Processes and Devices

المؤلفون: Uchida, T., Takashino, H., Tanizawa, M., Okagaki, T., Ishikawa, K., Eimori, T., Ohji, Y.

المصدر: 2005 International Conference On Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on. :199-202 2005

Relation: 2005 International Conference On Simulation of Semiconductor Processes and Devices

المؤلفون: Ishibashi, M., Kawasaki, Y., Horita, K., Kuroi, T., Yamashita, T., Shiga, K., Hayashi, T., Togawa, M., Eimori, T., Ohji, Y.

المصدر: Extended Abstracts of the Fifth International Workshop on Junction Technology Junction Technology Junction Technology, 2005. Extended Abstracts of the Fifth International Workshop on. :35-38 2005

Relation: Extended Abstracts of the Fifth International Workshop on Junction Technology

المؤلفون: Hayashi, Mizutani, M., Inoue, M., Yugami, J., Tsuchimoto, J., Anma, M., Komori, S., Tsukamoto, K., Tsukamoto, Y., Nii, K., Nishida, Y., Sayama, H., Yamashita, T., Oda, H., Eimori, T., Ohji, Y.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :906-909 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Ueno, S., Eimori, T., Kuroiwa, T., Furuta, H., Tsuchimoto, J., Maejima, S., Iida, S., Ohshita, H., Hasegawa, S., Hirano, S., Yamaguchi, T., Kurisu, H., Yutani, A., Hashikawa, N., Maeda, H., Ogawa, Y., Kawabata, K., Okumura, Y., Tsuji, T., Ohtani, J., Tanizaki, T., Yamaguchi, Y., Ohishi, T., Hidaka, H., Takenaga, T., Beysen, S., Kobayashi, H., Oomori, T., Koga T, Ohji, Y.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :579-582 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Tsuchiya, R., Horiuchi, M., Kimura, S., Yamaoka, M., Kawahara, T., Maegawa, S., Ipposhi, T., Ohji, Y., Matsuoka, H.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :631-634 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Aono, H., Murakami, E., Okuyama, K., Makabe, K., Kuroda, K., Watanabe, K., Ozaki, H., Yanagisawa, K., Kubota, K., Ohji, Y.

المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Reliability physics symposium Reliability Physics Symposium Proceedings, 2002. 40th Annual. :79-85 2002

Relation: 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual

المؤلفون: Kamohara, S., Kawakami, M., Kosaka, E., Ito, F., Okuyama, K., Ohji, Y.

المصدر: 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550) Statistical methodology Statistical Methodology, IEEE International Workshop on, 2001 6yh.. :21-24 2001

Relation: 2001 6th International Workshop on Statistical Methodology

المؤلفون: Kamohara, S., Ohuchi, T., Okuyama, K., Murakami, E., Kawashima, Y., Nishida, A., Suzuki, C., Ohji, Y., Kubota, K.

المصدر: 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550) Statistical methodology Statistical Methodology, IEEE International Workshop on, 2001 6yh.. :43-46 2001

Relation: 2001 6th International Workshop on Statistical Methodology