يعرض 1 - 10 نتائج من 85 نتيجة بحث عن '"On-chip sensors"', وقت الاستعلام: 1.10s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

    Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

  2. 2
    مؤتمر

    المؤلفون: Hill, Ian, Rendon, Mateo, Ivanov, Andre

    المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-7 Apr, 2024

    Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

  3. 3
    مؤتمر

    المصدر: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID), 2024 37th International Conference on. :443-448 Jan, 2024

    Relation: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)

  4. 4
    مؤتمر

    المصدر: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2023 26th International Symposium on. :13-20 May, 2023

    Relation: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

  5. 5
    دورية أكاديمية

    المؤلفون: Liu, J., Liu, Z., Hua, M., Jia, Y., Ma, J., Yu, M.

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(10):10285-10292 May, 2023

  6. 6
  7. 7
    كتاب إلكتروني

    المساهمون: Szefer, Jakub, editorAff1, Tessier, Russell, editorAff2

    المصدر: Security of FPGA-Accelerated Cloud Computing Environments. :101-135

  8. 8
    مؤتمر

    المصدر: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021. :1496-1499 Feb, 2021

    Relation: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  9. 9
    دورية أكاديمية

    المؤلفون: Li, Y., Zhao, H., Raza, A., Clemmen, S., Baets, R.

    المصدر: IEEE Journal of Quantum Electronics IEEE J. Quantum Electron. Quantum Electronics, IEEE Journal of. 56(1):1-8 Feb, 2020

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