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1دورية أكاديمية
المؤلفون: Onodera H, Urayama T, Hirota K, Maeda K, Kubota-Koketsu R, Takahashi K, Hagiwara K, Okuno Y, Ikuta K, Yunoki M
المصدر: Biologics: Targets & Therapy, Vol Volume 11, Pp 23-30 (2017)
مصطلحات موضوعية: IVIG, influenza, seasonal, neutralization, vaccine, Medicine (General), R5-920
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Li, Y., Lin, S., Nishizawa, S., Su, H., Fong, M., Chen, O., Onodera, H.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 41(12):5568-5581 Dec, 2022
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3دورية أكاديمية
المؤلفون: Onodera, H., Kabemura, T., Horio, K.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(11):6028-6034 Nov, 2022
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4مؤتمر
المؤلفون: Murakami, K., Islam, M., Onodera, H.
المصدر: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2021 IEEE 27th International Symposium on. :1-6 Jun, 2021
Relation: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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5دورية أكاديميةMOSDA: On-Chip Memory Optimized Sparse Deep Neural Network Accelerator With Efficient Index Matching
المؤلفون: Xu, H., Shiomi, J., Onodera, H.
المصدر: IEEE Open Journal of Circuits and Systems IEEE Open J. Circuits Syst. Circuits and Systems, IEEE Open Journal of. 2:144-155 2021
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6دورية أكاديمية
المؤلفون: Wang, Z., Onodera, H., Matsuhashi, R.
المصدر: IEEE Access Access, IEEE. 9:36266-36281 2021
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7مؤتمر
المؤلفون: Hiratsuka, A., Tsuchiya, A., Tanaka, K., Fukuyama, H., Miura, N., Nosaka, H., Onodera, H.
المصدر: 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC) Solid-State Circuits Conference (A-SSCC), 2018 IEEE Asian. :69-72 Nov, 2018
Relation: 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC)
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8دورية أكاديمية
المؤلفون: Banno, N., Okamoto, K., Iguchi, N., Ochi, H., Onodera, H., Hashimoto, M., Sugibayashi, T., Sakamoto, T., Tada, M.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(8):3331-3336 Aug, 2019
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9مؤتمر
المؤلفون: Tanaka, A., Kato, H., Tsutsumi, K., Shima, M., Uchida, T., Onodera, H.
المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018
Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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10دورية أكاديمية
المؤلفون: Ochi, H., Yamaguchi, K., Fujimoto, T., Hotate, J., Kishimoto, T., Higashi, T., Imagawa, T., Doi, R., Tada, M., Sugibayashi, T., Takahashi, W., Wakabayashi, K., Onodera, H., Mitsuyama, Y., Yu, J., Hashimoto, M.
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 26(12):2723-2736 Dec, 2018
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