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1مؤتمر
المؤلفون: Goel, S.K., Kuoshu Chiu, Marinissen, E.J., Nguyen, T., Oostdijk, S.
المصدر: Proceedings Design, Automation and Test in Europe Conference and Exhibition Design, automation and test in europe Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings. 3:108-113 Vol.3 2004
Relation: Proceedings. Design, Automation and Test in Europe Conference and Exhibition
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2مؤتمر
المؤلفون: Vermeulen, B., Oostdijk, S., Bouwman, F.
المصدر: Proceedings International Test Conference 2001 (Cat. No.01CH37260) International test conference Test Conference, 2001. Proceedings. International. :121-130 2001
Relation: Proceedings International Test Conference
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3مؤتمر
المؤلفون: Peters, F., Oostdijk, S.
المصدر: Digest of Papers 1996 IEEE International Workshop on IDDQ Testing IDDQ testing IDDQ Testing, 1996., IEEE International Workshop on. :4-8 1996
Relation: Digest of Papers 1996 IEEE International Workshop on IDDQ Testing
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4مؤتمر
المؤلفون: Bouwmeester, H., Oostdijk, S., Bouwmann, F., Stans, R., Thijssen, L., Beenker, F.
المصدر: Proceedings of IEEE International Test Conference - (ITC) International test conference Test Conference, 1993. Proceedings., International. :451-460 1993
Relation: Proceedings of IEEE International Test Conference - (ITC)
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5مؤتمر
المؤلفون: Bouwman, F., Oostdijk, S., Stans, R., Bennetts, B., Beenker, F.
المصدر: Proceedings International Test Conference 1992 Test Conference, 1992. Proceedings., International. :232 1992
Relation: Proceedings International Test Conference 1992
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6مؤتمر
المؤلفون: Vermeulen, B., Oostdijk, S., Bouwman, F.
المصدر: Proceedings International Test Conference 2001 (Cat. No.01CH37260); 2001, p121-130, 10p
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7مؤتمر
المؤلفون: Goel, S.K., Kuoshu Chiu, Marinissen, E.J., Nguyen, T., Oostdijk, S.
المصدر: Proceedings Design, Automation & Test in Europe Conference & Exhibition; 2004, p108-108, 1p
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