المؤلفون: Das, S, Hong, Z, Stoica, VA, Gonçalves, MAP, Shao, YT, Parsonnet, E, Marksz, EJ, Saremi, S, McCarter, MR, Reynoso, A, Long, CJ, Hagerstrom, AM, Meyers, D, Ravi, V, Prasad, B, Zhou, H, Zhang, Z, Wen, H, Gómez-Ortiz, F, García-Fernández, P, Bokor, J, Íñiguez, J, Freeland, JW, Orloff, ND, Junquera, J, Chen, LQ, Salahuddin, S, Muller, DA, Martin, LW, Ramesh, R

المصدر: Nature Materials. 20(2)

مصطلحات موضوعية: Nanoscience & Nanotechnology

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/7vd7m1tz

المؤلفون: Ryan HP; Cambridge University Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW, U.K., Fishman ZS; National Institute of Standards and Technology Communications Technology Laboratory, 325 Broadway, Boulder, Colorado 80305, United States., Pawlik JT; National Institute of Standards and Technology Communications Technology Laboratory, 325 Broadway, Boulder, Colorado 80305, United States., Grommet A; Cambridge University Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW, U.K., Musial M; National Institute of Standards and Technology Material Measurement Laboratory, 100 Bureau Dr., Gaithersburg, Maryland 20899, United States., Rizzuto F; Cambridge University Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW, U.K., Booth JC; National Institute of Standards and Technology Communications Technology Laboratory, 325 Broadway, Boulder, Colorado 80305, United States., Long CJ; National Institute of Standards and Technology Communications Technology Laboratory, 325 Broadway, Boulder, Colorado 80305, United States., Schwarz K; National Institute of Standards and Technology Material Measurement Laboratory, 100 Bureau Dr., Gaithersburg, Maryland 20899, United States., Orloff ND; National Institute of Standards and Technology Communications Technology Laboratory, 325 Broadway, Boulder, Colorado 80305, United States., Nitschke JR; Cambridge University Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW, U.K., Stelson AC; National Institute of Standards and Technology Communications Technology Laboratory, 325 Broadway, Boulder, Colorado 80305, United States.

المصدر: Journal of the American Chemical Society [J Am Chem Soc] 2023 Sep 13; Vol. 145 (36), pp. 19533-19541. Date of Electronic Publication: 2023 Aug 29.

نوع المنشور: Journal Article

بيانات الدورية: Publisher: American Chemical Society Country of Publication: United States NLM ID: 7503056 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1520-5126 (Electronic) Linking ISSN: 00027863 NLM ISO Abbreviation: J Am Chem Soc Subsets: PubMed not MEDLINE; MEDLINE

المؤلفون: Das S; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA. sujitdas@berkeley.edu.; Department of Physics, University of California, Berkeley, CA, USA. sujitdas@berkeley.edu., Hong Z; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.; Department of Mechanical Engineering, Carnegie Mellon University, Pittsburgh, PA, USA., Stoica VA; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA., Gonçalves MAP; Materials Research and Technology Department, Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxemburg.; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; Physics and Materials Science Research Unit, University of Luxembourg, Belvaux, Luxembourg., Shao YT; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Parsonnet E; Department of Physics, University of California, Berkeley, CA, USA., Marksz EJ; National Institute of Standards and Technology, Boulder, CO, USA., Saremi S; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA., McCarter MR; Department of Physics, University of California, Berkeley, CA, USA., Reynoso A; Department of Physics, University of California, Berkeley, CA, USA., Long CJ; National Institute of Standards and Technology, Boulder, CO, USA., Hagerstrom AM; National Institute of Standards and Technology, Boulder, CO, USA., Meyers D; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA., Ravi V; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA., Prasad B; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA., Zhou H; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA., Zhang Z; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA., Wen H; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA., Gómez-Ortiz F; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain., García-Fernández P; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain., Bokor J; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA., Íñiguez J; Materials Research and Technology Department, Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxemburg.; Physics and Materials Science Research Unit, University of Luxembourg, Belvaux, Luxembourg., Freeland JW; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA., Orloff ND; National Institute of Standards and Technology, Boulder, CO, USA., Junquera J; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain., Chen LQ; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA., Salahuddin S; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA., Muller DA; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.; Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA., Martin LW; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA., Ramesh R; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA. rramesh@berkeley.edu.; Department of Physics, University of California, Berkeley, CA, USA. rramesh@berkeley.edu.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. rramesh@berkeley.edu.

المصدر: Nature materials [Nat Mater] 2021 Jun; Vol. 20 (6), pp. 905.

نوع المنشور: Published Erratum

بيانات الدورية: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101155473 Publication Model: Print Cited Medium: Internet ISSN: 1476-4660 (Electronic) Linking ISSN: 14761122 NLM ISO Abbreviation: Nat Mater Subsets: PubMed not MEDLINE; MEDLINE

المؤلفون: Dawley NM; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA., Marksz EJ; Department of Materials Science and Engineering, University of Maryland, College Park, MD, USA.; National Institute of Standards and Technology, Boulder, CO, USA., Hagerstrom AM; National Institute of Standards and Technology, Boulder, CO, USA., Olsen GH; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Holtz ME; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Goian V; Institute of Physics ASCR, Prague, Czech Republic., Kadlec C; Institute of Physics ASCR, Prague, Czech Republic., Zhang J; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA., Lu X; National Institute of Standards and Technology, Boulder, CO, USA., Drisko JA; National Institute of Standards and Technology, Boulder, CO, USA., Uecker R; Leibniz-Institut für Kristallzüchtung, Berlin, Germany., Ganschow S; Leibniz-Institut für Kristallzüchtung, Berlin, Germany., Long CJ; National Institute of Standards and Technology, Boulder, CO, USA., Booth JC; National Institute of Standards and Technology, Boulder, CO, USA., Kamba S; Institute of Physics ASCR, Prague, Czech Republic., Fennie CJ; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Muller DA; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Orloff ND; National Institute of Standards and Technology, Boulder, CO, USA., Schlom DG; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA. schlom@cornell.edu.; Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA. schlom@cornell.edu.

المصدر: Nature materials [Nat Mater] 2020 Feb; Vol. 19 (2), pp. 176-181. Date of Electronic Publication: 2019 Dec 23.

نوع المنشور: Journal Article

بيانات الدورية: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101155473 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1476-4660 (Electronic) Linking ISSN: 14761122 NLM ISO Abbreviation: Nat Mater Subsets: PubMed not MEDLINE; MEDLINE

المؤلفون: Hagerstrom AM; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA.; Department of Physics, University of Colorado, Boulder, Colorado 80309, USA., Marksz EJ; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA.; Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA., Zhang X; Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA., Lu X; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA.; Department of Physics, University of Colorado, Boulder, Colorado 80309, USA., Long CJ; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA., Booth JC; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA., Takeuchi I; Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA., Orloff ND; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA.

المصدر: Physical review applied [Phys Rev Appl] 2020; Vol. 13 (4).

نوع المنشور: Journal Article

بيانات الدورية: Publisher: American Physical Society Country of Publication: United States NLM ID: 101633995 Publication Model: Print Cited Medium: Print ISSN: 2331-7019 (Print) Linking ISSN: 23317019 NLM ISO Abbreviation: Phys Rev Appl Subsets: PubMed not MEDLINE

المؤلفون: Stelson AC; National Institute of Standards and Technology, Radio Frequency Electronics Group, Boulder CO 325 Broadway St, Boulder, CO, 80305, USA., Liu M; School of Molecular Sciences, Arizona State University, 551 E University Dr, Tempe, AZ, 85281, USA.; Center for Molecular Design and Biomimetics, The Biodesign Institute, Arizona State University, 727 E. Tyler St., Tempe, AZ, 85281, USA., Little CAE; National Institute of Standards and Technology, Radio Frequency Electronics Group, Boulder CO 325 Broadway St, Boulder, CO, 80305, USA., Long CJ; National Institute of Standards and Technology, Radio Frequency Electronics Group, Boulder CO 325 Broadway St, Boulder, CO, 80305, USA., Orloff ND; National Institute of Standards and Technology, Radio Frequency Electronics Group, Boulder CO 325 Broadway St, Boulder, CO, 80305, USA., Stephanopoulos N; School of Molecular Sciences, Arizona State University, 551 E University Dr, Tempe, AZ, 85281, USA. nstepha1@asu.edu.; Center for Molecular Design and Biomimetics, The Biodesign Institute, Arizona State University, 727 E. Tyler St., Tempe, AZ, 85281, USA. nstepha1@asu.edu., Booth JC; National Institute of Standards and Technology, Radio Frequency Electronics Group, Boulder CO 325 Broadway St, Boulder, CO, 80305, USA. james.booth@nist.gov.

المصدر: Nature communications [Nat Commun] 2019 Mar 12; Vol. 10 (1), pp. 1174. Date of Electronic Publication: 2019 Mar 12.

نوع المنشور: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.

بيانات الدورية: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE

مواضيع طبية MeSH: Lab-On-A-Chip Devices* , Nucleic Acid Conformation*, DNA/*chemistry , Microfluidics/*instrumentation , Nanostructures/*chemistry, High-Throughput Screening Assays/instrumentation ; High-Throughput Screening Assays/methods ; Microfluidics/methods ; Microwaves ; Models, Chemical

المؤلفون: Little CAE; Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309, USA., Orloff ND, Hanemann IE, Long CJ, Bright VM, Booth JC

المصدر: Lab on a chip [Lab Chip] 2017 Jul 25; Vol. 17 (15), pp. 2674-2681.

نوع المنشور: Journal Article

بيانات الدورية: Publisher: Royal Society of Chemistry Country of Publication: England NLM ID: 101128948 Publication Model: Print Cited Medium: Internet ISSN: 1473-0189 (Electronic) Linking ISSN: 14730189 NLM ISO Abbreviation: Lab Chip Subsets: PubMed not MEDLINE

المؤلفون: Long CJ, Orloff ND, Twedt KA, Lam T, Vargas-Lara F, Zhao M, Natarajan B, Scott KC, Marksz E; Department of Mechanical Engineering & Materials Science, University of Pittsburgh , Pittsburgh, Pennsylvania 15260, United States., Nguyen T, Douglas JF, McClelland J, Garboczi E, Obrzut J, Liddle JA

المصدر: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2016 Sep 07; Vol. 8 (35), pp. 23230-5. Date of Electronic Publication: 2016 Aug 29.

نوع المنشور: Journal Article

بيانات الدورية: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE

المؤلفون: Williams TS; NASA John H. Glenn Research Center at Lewis Field , Cleveland, Ohio 44135, United States., Orloff ND; Materials Measurement Laboratory, National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States.; Communications Technology Laboratory, National Institute of Standards and Technology , Boulder, Colorado 80305, United States., Baker JS; NASA Postdoctoral Program, NASA Glenn Research Center , Cleveland, Ohio 44135, United States., Miller SG; NASA John H. Glenn Research Center at Lewis Field , Cleveland, Ohio 44135, United States., Natarajan B; Center for Nanoscale Science and Technology, National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States., Obrzut J; Materials Measurement Laboratory, National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States., McCorkle LS; Ohio Aerospace Institute , Cleveland, Ohio 44142, United States., Lebron-Colón M; NASA John H. Glenn Research Center at Lewis Field , Cleveland, Ohio 44135, United States., Gaier J; NASA John H. Glenn Research Center at Lewis Field , Cleveland, Ohio 44135, United States., Meador MA; NASA John H. Glenn Research Center at Lewis Field , Cleveland, Ohio 44135, United States., Liddle JA; Communications Technology Laboratory, National Institute of Standards and Technology , Boulder, Colorado 80305, United States.

المصدر: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2016 Apr 13; Vol. 8 (14), pp. 9327-34. Date of Electronic Publication: 2016 Apr 04.

نوع المنشور: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.

بيانات الدورية: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE

المؤلفون: Mirri F; Department of Chemical and Biomolecular Engineering, Rice University , Houston, Texas 77005, United States.; Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University , Houston, Texas 77005, United States., Orloff ND; Communications Technology Laboratory, National Institute of Standard and Technology , Boulder, Colorado 80305, United States.; Material Science and Engineering Division, National Institute of Standard and Technology , Gaithersburg, Maryland 20899, United States., Forster AM; Materials and Structural System Division, National Institute of Standard and Technology , Gaithersburg, Maryland 20899, United States., Ashkar R; NIST Center for Neutron Research, National Institute of Standard and Technology , Gaithersburg, Maryland 20899, United States.; Materials Science and Engineering Department, University of Maryland , College Park, Maryland 20742, United States.; Biology and Soft Matter Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States., Headrick RJ; Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University , Houston, Texas 77005, United States.; Department of Chemistry, Rice University , Houston, Texas 77005, United States., Bengio EA; Department of Chemical and Biomolecular Engineering, Rice University , Houston, Texas 77005, United States.; Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University , Houston, Texas 77005, United States., Long CJ; Center for Nanoscale Science and Technology, National Institute of Standard and Technology , Gaithersburg, Maryland 20899, United States.; Maryland Nanocenter, University of Maryland , College Park, Maryland 20742, United States., Choi A; Department of Chemical and Biomolecular Engineering, Rice University , Houston, Texas 77005, United States., Luo Y; Department of Chemical and Biomolecular Engineering, Rice University , Houston, Texas 77005, United States., Walker AR; Physical Measurement Laboratory, National Institute of Standard and Technology (NIST) , Gaithersburg, Maryland 20899, United States., Butler P; NIST Center for Neutron Research, National Institute of Standard and Technology , Gaithersburg, Maryland 20899, United States., Migler KB; Material Science and Engineering Division, National Institute of Standard and Technology , Gaithersburg, Maryland 20899, United States., Pasquali M; Department of Chemical and Biomolecular Engineering, Rice University , Houston, Texas 77005, United States.; Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University , Houston, Texas 77005, United States.; Department of Chemistry, Rice University , Houston, Texas 77005, United States.

المصدر: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2016 Feb; Vol. 8 (7), pp. 4903-10. Date of Electronic Publication: 2016 Feb 15.

نوع المنشور: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.

بيانات الدورية: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE