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1مؤتمر
المؤلفون: Yasunaga, Shun, Misumi, Kei, Mizushima, Ayako, Toyokura, Atsushi, Ota, Etsuko, Inoue, Yurie, Fujiwara, Makoto, Kawai, Noriko, Yoda, Mitsuhiro, Tsuboi, Shinji, Sawamura, Tomoki, Higo, Akio, Nakane, Ryosho, Ochiai, Yukinori, Mita, Yoshio
المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-4 Apr, 2024
Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
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2مؤتمر
المؤلفون: Mizushima, Ayako, Reddy, R Ranga, Konishi, Kuniaki, Ezawa, Tomoya, Ota, Etsuko, Kuwata-Gonokami, Makoto, Mita, Yoshio
المصدر: 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP), 2020 Symposium on. :1-4 Jun, 2020
Relation: 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP)
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3مؤتمر
المؤلفون: Usami, Naoto, Ota, Etsuko, Higo, Akio, Momose, Takeshi, Mita, Yoshio
المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-4 May, 2020
Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
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4مؤتمرContinuity assessment for supercritical-fluids-deposited (SCFD) Cu film as electroplating seed layer
المؤلفون: Usami, Naoto, Ota, Etsuko, Higo, Akio, Momose, Takeshi, Mita, Yoshio
المصدر: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :54-57 Mar, 2019
Relation: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)
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5مؤتمر
المؤلفون: Higo, Akio, Sawamura, Tomoki, Fujiwara, Makoto, Ota, Etsuko, Mizushima, Ayako, Lebrasseur, Eric, Arakawa, Taro, Mita, Yoshio
المصدر: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :4-7 Mar, 2019
Relation: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)
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6
المؤلفون: Ota, Etsuko, Bourrier, David, Usami, Naoto, Mizushima, Ayako, Shimamoto, Naonobu, Momose, Takeshi, Higo, Akio, Granier, Hugues, Mita, Yoshio
المساهمون: The University of Tokyo (UTokyo), Service Techniques et Équipements Appliqués à la Microélectronique (LAAS-TEAM), Laboratoire d'analyse et d'architecture des systèmes (LAAS), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT), Renatech Euronanolab
المصدر: ENRIS 2023
ENRIS 2023, Renatech Euronanolab, May 2023, Paris Saclay, Franceمصطلحات موضوعية: [SPI]Engineering Sciences [physics]
URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______4074::a4be6f19bda936f16892f276856061c9
https://hal.laas.fr/hal-04131030 -
7
المؤلفون: Shimamoto, Naonobu, Mizushima, Ayako, Bourrier, David, Ota, Etsuko, Higo, Akio, Granier, Hugues, Kosuge, Atsutake, Ikeda, Makoto, Kuroda, Tadahiro, Mita, Yoshio
المساهمون: The University of Tokyo (UTokyo), Service Techniques et Équipements Appliqués à la Microélectronique (LAAS-TEAM), Laboratoire d'analyse et d'architecture des systèmes (LAAS), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT), Renatech Euronanolab
المصدر: ENRIS 2023
ENRIS 2023, Renatech Euronanolab, May 2023, Paris Saclay, Franceمصطلحات موضوعية: [SPI]Engineering Sciences [physics]
URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______4074::d05376eba5bb5c75feb35582a69dcce6
https://hal.laas.fr/hal-04131037/file/abstract_ENRIS2023_shimamoto_v2.pdf -
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9دورية أكاديمية
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10دورية أكاديمية
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تسجيل الدخول للوصول الكامل.
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