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1مؤتمر
المؤلفون: Hamai, Takamasa, Suzuki, Kunifumi, Ichihara, Reika, Higashi, Yusuke, Yoshimura, Yoko, Sakuma, Kiwamu, Ota, Kensuke, Takahashi, Kota, Matsuo, Kazuhiro, Fujii, Shosuke, Saitoh, Masumi
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023
Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)
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2مؤتمر
المؤلفون: Tanaka, Hitomi, Aiba, Yuta, Maeda, Takashi, Ota, Kensuke, Higashi, Yusuke, Sawa, Keiichi, Kikushima, Fumie, Miura, Masayuki, Sanuki, Tomoya
المصدر: 2022 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2022 IEEE International. :1-4 May, 2022
Relation: 2022 IEEE International Memory Workshop (IMW)
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3مؤتمر
المؤلفون: Yamaguchi, Marina, Fujii, Shosuke, Ota, Kensuke, Saitoh, Masumi
المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020
Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)
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4مؤتمر
المؤلفون: Saitoh, Masumi, Fujii, Shosuke, Oda, Minoru, Yamaguchi, Marina, Kabuyanagi, Shoichi, Yoshimura, Yoko, Ota, Kensuke, Sakuma, Kiwamu, Kamimuta, Yuuichi
المصدر: 2018 48th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2018 48th European. :138-141 Sep, 2018
Relation: ESSDERC 2018 - 48th European Solid-State Device Research Conference (ESSDERC)
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5مؤتمر
المصدر: 2019 Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2019. :169-171 Mar, 2019
Relation: 2019 Electron Devices Technology and Manufacturing Conference (EDTM)
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6مؤتمر
المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Relation: 2020 IEEE Symposium on VLSI Technology
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7مؤتمر
المؤلفون: Saitoh, Masumi, Ichihara, Reika, Yamaguchi, Marina, Suzuki, Kunifumi, Takano, Keisuke, Akari, Keisuke, Takahashi, Kota, Kamiya, Yuta, Matsuo, Kazuhiro, Kamimuta, Yuuichi, Sakuma, Kiwamu, Ota, Kensuke, Fujii, Shosuke
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :18.1.1-18.1.4 Dec, 2020
Relation: 2020 IEEE International Electron Devices Meeting (IEDM)
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8مؤتمر
المؤلفون: Berdan, Radu, Marukame, Takao, Kabuyanagi, Shoichi, Ota, Kensuke, Saitoh, Masumi, Fujii, Shosuke, Deguchi, Jun, Nishi, Yoshifumi
المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T22-T23 Jun, 2019
Relation: 2019 Symposium on VLSI Technology
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9مؤتمر
المؤلفون: Tanaka, Chika, Saitoh, Masumi, Ota, Kensuke, Numata, Toshinori
المصدر: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. :151-154 Mar, 2013
Relation: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)
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10مؤتمر
المؤلفون: Ota, Kensuke, Katagiri, Shigeru, Ohsaki, Miho
المصدر: TENCON 2012 IEEE Region 10 Conference TENCON 2012 - 2012 IEEE Region 10 Conference. :1-6 Nov, 2012
Relation: TENCON 2012 - 2012 IEEE Region 10 Conference