يعرض 1 - 10 نتائج من 10,495 نتيجة بحث عن '"Ottaviano, A."', وقت الاستعلام: 1.02s تنقيح النتائج
  1. 1
    دورية أكاديمية

    المؤلفون: Balas, R., Ottaviano, A., Benini, L.

    المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 32(6):1032-1044 Jun, 2024

  2. 2
    مؤتمر

    المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

    Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  3. 3
    مؤتمر

    المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

    Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  4. 4
    مؤتمر

    المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

    Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  5. 5
  6. 6
  7. 7
  8. 8
    مؤتمر

    المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-2 Mar, 2024

    Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  9. 9
    مؤتمر

    المصدر: 2023 12th Mediterranean Conference on Embedded Computing (MECO) Embedded Computing (MECO), 2023 12th Mediterranean Conference on. :1-8 Jun, 2023

    Relation: 2023 12th Mediterranean Conference on Embedded Computing (MECO)

  10. 10
    مؤتمر

    المصدر: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S) DSN-S Dependable Systems and Networks - Supplemental Volume (DSN-S), 2023 53rd Annual IEEE/IFIP International Conference on. :84-88 Jun, 2023

    Relation: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)