المؤلفون: Lan, Guoyu, Otte, Rik, Goumans, Leon, Hsu, Andy, Roberts, Harry, Kung, Terry

المصدر: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-4 Jul, 2023

Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Lai, Shih Chia, Sharma, Pradeep, Otte, Rik, Kung, Jung Hao, Wang, Yao-han, Chen, Sharon

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :56-60 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: van der Wel, Paul J., Otte, Rik, Roberts, Harry, de Bruijn, Frank, van Zuijlen, Albert, Merkus, Ben

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :PA-2.1-PA-2.5 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Otte, Rik J., Fonville, Rob F., Knotter, Martin D.

المصدر: In Microelectronics Reliability September 2017 76-77:426-430

المؤلفون: Otte, Rik J., Agterberg, Martijn J. H., Van Wanrooij, Marc M., Snik, Ad F. M., Van Opstal, A. John

المصدر: Journal of the Association for Research in Otolaryngology. April 2013 14(2):261-273