المؤلفون: Nan, Siti Nurjatikesuma Che, Oung, Pey Fen, Lee, Chong Haw

المصدر: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-5 Jul, 2023

Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Che Nan Siti Nurjatikesuma, Loo Huey Wen, Oung Pey Fen, Lee Chong Haw

المصدر: International Symposium for Testing and Failure Analysis.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ab147c9156afaf0eba886da5faf213b
https://doi.org/10.31399/asm.cp.istfa2022p0343