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المؤلفون: Xinwang Liu, Tom Herrmann, G. Festes, B. Bertello, Yuri Tkachev, Boris Bayha, M. Duggan, Ralf Richter, Alban Zaka, Decobert Catherine, Thomas Melde, S. Wittek, Stefan Dunkel, N. Do, P. Ghazav, N. Bollon, F. Mauersberger, Sven Beyer, Kim Jinho, Viktor Markov, B. Muller, Zhou Feng, S. Jourba, M. Trentzsch
المصدر: 2020 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: 010302 applied physics, Computer science, business.industry, Transistor, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, law.invention, Flash (photography), Reliability (semiconductor), CMOS, Memory cell, law, 0103 physical sciences, Process integration, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Data retention, Metal gate, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::68d6b99bb8692b55d9511f87f7674fd4
https://doi.org/10.1109/imw48823.2020.9108118