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المؤلفون: D. Greiner, N. Meyer, V. Hinrichs, W. Ludwig, D. Keiper, Konstantinos Fostiropoulos, P.K. Baumann, Marin Rusu, M. Ch. Lux-Steiner, S. Wiesner, Michael Heuken
المصدر: Thin Solid Films. 534:255-259
مصطلحات موضوعية: Chemistry, business.industry, Ultra-high vacuum, Metals and Alloys, Analytical chemistry, Surfaces and Interfaces, Molar absorptivity, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Chamber pressure, chemistry.chemical_compound, Optics, Diindenoperylene, Attenuation coefficient, Physical vapor deposition, Materials Chemistry, Thin film, business, Refractive index
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المؤلفون: Robert J. Nemanich, P.K. Baumann
المصدر: Scopus-Elsevier
مصطلحات موضوعية: Materials science, Annealing (metallurgy), Photoemission spectroscopy, Schottky barrier, Analytical chemistry, Diamond, chemistry.chemical_element, engineering.material, Copper, Field electron emission, chemistry, Electron affinity, engineering, Atomic physics, Deposition (law)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::39c04eb33a07b24e896fb95e3c6a8b2e
https://doi.org/10.1103/physrevb.58.1643 -
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المؤلفون: Okhyun Nam, A. T. Sowers, M. C. Benjamin, B. L. Ward, Robert J. Nemanich, Robert F. Davis, Harald Ade, P.K. Baumann
المصدر: Applied Surface Science. :694-703
مصطلحات موضوعية: business.industry, Chemistry, Wide-bandgap semiconductor, General Physics and Astronomy, Diamond, Surfaces and Interfaces, General Chemistry, Nitride, engineering.material, Condensed Matter Physics, Epitaxy, Surfaces, Coatings and Films, Field electron emission, X-ray photoelectron spectroscopy, Electron affinity, engineering, Optoelectronics, Atomic physics, business, Spectroscopy
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المؤلفون: Robert J. Nemanich, P.K. Baumann
المصدر: Journal of Applied Physics. 83:2072-2082
مصطلحات موضوعية: congenital, hereditary, and neonatal diseases and abnormalities, Zirconium, Materials science, Annealing (metallurgy), Photoemission spectroscopy, Schottky barrier, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Diamond, engineering.material, body regions, Field electron emission, chemistry, hemic and lymphatic diseases, Electron affinity, parasitic diseases, engineering, Thin film
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المؤلفون: P.K. Baumann, Robert J. Nemanich, B. L. Ward, S. P. Bozeman
المصدر: Scopus-Elsevier
مصطلحات موضوعية: Materials science, Photoemission spectroscopy, Mechanical Engineering, Schottky barrier, Analytical chemistry, chemistry.chemical_element, Diamond, General Chemistry, engineering.material, Oxygen, Electronic, Optical and Magnetic Materials, Metal, Field electron emission, chemistry, Electric field, visual_art, Electron affinity, Materials Chemistry, visual_art.visual_art_medium, engineering, Electrical and Electronic Engineering
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المؤلفون: X. Garros, P. Caubet, L. Tosti, Francois Andrieu, N. Allouti, C. Le Royer, F. Ponthenier, Sébastien Barnola, P.K. Baumann, S. Morvan, U. Weber, P. Perreau, Gerard Ghibaudo, A. Seignard, C. Euvrard, Yves Morand, Maurice Rivoire, L. Desvoivres, M.-C. Roure, C. Leroux, F. Martin, R. Gassilloud, M. Casse, Olivier Weber, Thierry Poiroux, Pascal Besson
المساهمون: Laboratoire de géologie de l'ENS (LGENS), Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)-Département des Géosciences - ENS Paris, École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Département d'Astrophysique, de physique des Particules, de physique Nucléaire et de l'Instrumentation Associée (DAPNIA), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Géosciences Environnement Toulouse (GET), Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Observatoire Midi-Pyrénées (OMP), Météo France-Centre National d'Études Spatiales [Toulouse] (CNES)-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Météo France-Centre National d'Études Spatiales [Toulouse] (CNES)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD), STMicroelectronics [Crolles] (ST-CROLLES), UMR CNRS 8179, Université de Lille, Sciences et Technologies-Centre National de la Recherche Scientifique (CNRS), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), École normale supérieure - Paris (ENS-PSL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-École normale supérieure - Paris (ENS-PSL), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut national des sciences de l'Univers (INSU - CNRS)-Observatoire Midi-Pyrénées (OMP), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National d'Études Spatiales [Toulouse] (CNES)-Centre National de la Recherche Scientifique (CNRS)-Météo-France -Institut de Recherche pour le Développement (IRD)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National d'Études Spatiales [Toulouse] (CNES)-Centre National de la Recherche Scientifique (CNRS)-Météo-France -Centre National de la Recherche Scientifique (CNRS), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)
المصدر: Microelectronic Engineering
Microelectronic Engineering, Elsevier, 2013, 109, pp.306-309. ⟨10.1016/j.mee.2013.03.045⟩
Microelectronic Engineering, 2013, 109, pp.306-309. ⟨10.1016/j.mee.2013.03.045⟩مصطلحات موضوعية: 010302 applied physics, Electron mobility, Materials science, business.industry, Silicon on insulator, Time-dependent gate oxide breakdown, Equivalent oxide thickness, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Gate oxide, 0103 physical sciences, MOSFET, Optoelectronics, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS, Leakage (electronics)
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المؤلفون: Robert J. Nemanich, P.K. Baumann
المصدر: Applied Surface Science. :267-273
مصطلحات موضوعية: Auger electron spectroscopy, Schottky barrier, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Diamond, Surfaces and Interfaces, General Chemistry, engineering.material, Condensed Matter Physics, Evaporation (deposition), Surfaces, Coatings and Films, chemistry, X-ray photoelectron spectroscopy, Electron affinity, engineering, Thin film, Cobalt
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المؤلفون: P.K. Baumann, Robert J. Nemanich
المصدر: Diamond and Related Materials. 4:802-805
مصطلحات موضوعية: Photoemission spectroscopy, Annealing (metallurgy), Chemistry, Mechanical Engineering, Analytical chemistry, Diamond, General Chemistry, Plasma, engineering.material, Electronic, Optical and Magnetic Materials, X-ray photoelectron spectroscopy, Electron diffraction, Electron affinity, Materials Chemistry, engineering, Electrical and Electronic Engineering, Surface states
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المؤلفون: Robert J. Nemanich, P.K. Baumann, Nalin R. Parikh, Lisa M. Porter, K. Ishibashi, T. P. Humphreys, Robert F. Davis
المصدر: Diamond and Related Materials. 3:883-886
مصطلحات موضوعية: Materials science, Photoemission spectroscopy, Mechanical Engineering, Schottky barrier, Analytical chemistry, Diamond, General Chemistry, Adhesion, engineering.material, medicine.disease_cause, Epitaxy, Evaporation (deposition), Electronic, Optical and Magnetic Materials, Electron diffraction, Materials Chemistry, medicine, engineering, Electrical and Electronic Engineering, Ultraviolet
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المؤلفون: François Martin, By. Nguyen, F. Allain, Walter Schwarzenbach, O. Rozeau, Olivier Weber, Frederic Boeuf, Sébastien Barnola, C. Fenouillet-Beranger, P. Perreau, Charles Leroux, X. Garros, R. Gassilloud, Olivier P. Thomas, M. Casse, Thomas Skotnicki, O. Boissière, P.K. Baumann, M-A. Jaud, Francois Andrieu, J.-P. Noel, U. Weber, L. Brevard, Konstantin Bourdelle, O. Faynot, J. Mazurier, Christian Arvet, Claude Tabone, Thierry Poiroux, Alain Toffoli, D. Lafond, L. Tosti, P. Lehnen
المصدر: 2010 International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, chemistry.chemical_element, Silicon on insulator, PMOS logic, CMOS, chemistry, Low-power electronics, Logic gate, MOSFET, Optoelectronics, Tin, business, NMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ff0bdcaa13c9bb633ae504a9a597ceed
https://doi.org/10.1109/iedm.2010.5703289
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