المؤلفون: Modolo, N., De Santi, C., Sicre, S., Minetto, A., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 39(6):7045-7051 Jun, 2024

المؤلفون: Lin, Z., Kang, L., Zhao, J., Yin, Y., Wang, Z., Yu, J., Li, Y., Yi, G., Nathan, A., Li, X., Wu, Y., Xu, J., Si, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):3002-3008 May, 2024

المؤلفون: Liu, G., Kong, Q., Zhang, D., Wang, X., Zhou, Z., Jiao, L., Han, K., Kang, Y., Nguyen, B., Ni, K., Gong, X.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):2995-3001 May, 2024

المؤلفون: Xue, Yongkang, Yuan, Miaojia, Li, Yu, Wang, Da, Wu, Maokun, Ren, Pengpeng, Zhang, Lining, Wang, Runsheng, Ji, Zhigang, Huang, Ru

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-5 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Rinaudo, Pietro, Chasin, Adrian, Zhao, Ying, Kaczer, Ben, Rassoul, Nouredine, Dekkers, Harold F.W., van Setten, Michiel J., Belmonte, Attilio, De Wolf, Ingrid, Kar, Gouri, Franco, Jacopo

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Zagni, N., Fregolent, M., Verzellesi, G., Marcuzzi, A., De Santi, C., Meneghesso, G., Zanoni, E., Treidel, E.B., Brusaterra, E., Brunner, F., Hilt, O., Meneghini, M., Pavan, P.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1561-1566 Mar, 2024

المؤلفون: Kikuta, Daisuke, Kishida, Ryo, Kobayashi, Kazutoshi

المصدر: 2023 IEEE 15th International Conference on ASIC (ASICON) ASIC (ASICON), 2023 IEEE 15th International Conference on. :1-4 Oct, 2023

Relation: 2023 IEEE 15th International Conference on ASIC (ASICON)

المؤلفون: Luan, Tiantian, Huang, Sen, Yao, Yixu, Jiang, Qimeng, Wang, Yuhao, Huang, Yifei, Feng, Chao, Wang, Xinhua, Liu, Xinyu, Wang, Ronghua, Ren, Yongshuo, Cheng, Wanxi, Liang, Huinan

المصدر: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2023 35th International Symposium on. :103-106 May, 2023

Relation: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

المؤلفون: Tselios, K., Knobloch, T., Waldhoer, D., Stampfer, B., Ioannidis, E., Enichlmair, H., Minixhofer, R., Grasser, T., Waltl, M.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):355-362 Sep, 2023

المؤلفون: Joy, Soumitra, Joshi, Kaustubh, Zubair, Ahmad, Bader, Samuel, Peck, Jason, Beumer, Michael, Koirala, Pratik, Radosavljevic, Marko, Vora, Heli, Meric, Inanc, Then, Han Wui

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :6B.1-1-6B.1-6 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)