المؤلفون: Vavrille, B., Vignoud, L., Chapelon, L., Estevez, R.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 37(3):251-259 Aug, 2024

المؤلفون: Keezer, David, Minier, Dany, Li, Hongjie

المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024

Relation: 2024 IEEE European Test Symposium (ETS)

المؤلفون: Wright, Oliver B., Tomoda, Motonobu, Otsuka, Paul H., Matsuda, Osamu

المصدر: 2024 IEEE MTT-S International Conference on Microwave Acoustics & Mechanics (IC-MAM) Microwave Acoustics & Mechanics (IC-MAM), 2024 IEEE MTT-S International Conference on. :113-116 May, 2024

Relation: 2024 IEEE MTT-S International Conference on Microwave Acoustics & Mechanics (IC-MAM)

المؤلفون: Mutze, Marco, Bakkal, Armin, Schaffer, Petr, Plettemeier, Dirk

المصدر: 2024 15th German Microwave Conference (GeMiC) German Microwave Conference (GeMiC), 2024 15th. :323-326 Mar, 2024

Relation: 2024 15th German Microwave Conference (GeMiC)

المؤلفون: Rahman, MuhibUr, Wu, Ke

المصدر: 2023 53rd European Microwave Conference (EuMC) Microwave Conference (EuMC), 2023 53rd European. :1028-1031 Sep, 2023

Relation: 2023 53rd European Microwave Conference (EuMC)

المؤلفون: Cao, F., Jiang, D., Liu, Y., Tian, Y., Ran, X., Long, Y., Ito, T., Hu, X., Weng, G., Akiyama, H., Chen, S.

المصدر: IEEE Photonics Journal IEEE Photonics J. Photonics Journal, IEEE. 16(1):1-8 Feb, 2024

المؤلفون: Keezer, David, Minier, Dany, Li, Hongjie

المصدر: 2023 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2023 IEEE International. :1-6 Sep, 2023

Relation: 2023 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Fu, Lei, Li, Qing, Qu, Bayi

المصدر: 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2023 IEEE 16th International Conference on. :7-11 Aug, 2023

Relation: 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)

المؤلفون: Sun, Fanqi, You, Xiaoli, Zhou, Yuhao, Wang, Minghao, Xu, Mengfei, Yuan, Xichen, Chang, Honglong, Liu, Jingquan, Ji, Bowen

المصدر: 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers) Solid-State Sensors, Actuators and Microsystems (Transducers), 2023 22nd International Conference on. :322-325 Jun, 2023

Relation: 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)

المؤلفون: Rozental, R.M., Ivanov, A.A., Sidorov, D.A., Vilkov, M.N.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(11):5940-5945 Nov, 2023