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1مؤتمر
المؤلفون: Roggero, R., Croce, G., Gattari, P., Castellana, E., Molfese, A., Marchesi, G., Atzeni, L., Buran, C., Paleari, A., Ballarin, G., Manzini, S., Alagi, F., Pizzo, G.
المصدر: 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on. :361-364 May, 2013
Relation: 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
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2مؤتمر
المؤلفون: Molfese, A., Gattari, P., Marchesi, G., Croce, G., Pizzo, G., Alagi, F., Borella, F.
المصدر: 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on. :340-343 May, 2011
Relation: 2011 23rd International Symposium on Power Semiconductor Devices & IC's (ISPSD)
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3دورية أكاديمية
المؤلفون: Di Biccari, L., Cerati, L., Pozzobon, F., Zullino, L., Morin, S., Pizzo, G., Boroni, A., Andreini, A.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 15(3):280-288 Sep, 2015
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4مؤتمر
المؤلفون: Marchesi, G., Cambieri, J., Dundulachi, A., Pizzo, G., Pozzobon, F., Annese, M., Andreini, A., Croce, G.
المصدر: 2008 20th International Symposium on Power Semiconductor Devices and IC's Power Semiconductor Devices and IC's, 2008. ISPSD '08. 20th International Symposium on. :275-278 May, 2008
Relation: 2008 International Symposium onn Power Semiconductor Devices & IC's (ISPSD)
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5مؤتمر
المؤلفون: Ferlito, E. P., Pizzo, G., De Gregorio, R., Anastasi, G., Ricciari, R., Mello, D.
المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :5B.3.1-5B.3.7 Apr, 2013
Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)
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6مؤتمر
المؤلفون: Pozzobon, F., Paci, D., Pizzo, G., Buri, A., Morin, S., Carace, F., Andreini, A., Gastaldi, D., Bertarelli, E., Lucchini, R., Vena, P.
المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :5C.4.1-5C.4.8 Apr, 2013
Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)
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7دورية أكاديمية
المؤلفون: Ricciari, R., Ferlito, E.P., Pizzo, G., Padalino, M., Anastasi, G., Sacchi, M., Pappalardo, G., Consalvo, C., Mello, D.
المصدر: In Microelectronics Reliability August-September 2015 55(9-10):1617-1621
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8دورية أكاديمية
المؤلفون: MALATO, A., SACCULLO, G., LO COCO, L., CARAMAZZA, D., ABBENE, I., PIZZO, G., CASUCCIO, A., SIRAGUSA, S. *
المصدر: In Journal of Thrombosis and Haemostasis January 2010 8(1):107-113
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9دورية أكاديمية
المؤلفون: Buscemi, S., Verga, S., Donatelli, M., D’Orio, L., Mattina, A., Tranchina, M. R., Pizzo, G., Mulè, G., Cerasola, G.
المصدر: Journal of Endocrinological Investigation. June 2009 32(6):538-541
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10
المؤلفون: Maltese A. M., Buttacavoli F., Pizzo G., Giuliana G
المساهمون: Di Fede, O, Fiorentino, E, Maltese, A.M., Buttacavoli, F., Pizzo, G., Giuliana, G
مصطلحات موضوعية: Settore MED/28 - Malattie Odontostomatologiche, caries, periodontal disease, pediatric subject, Italy, epidemiology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______3658::0009048e0077f03e26d8959d90bee598
http://hdl.handle.net/10447/400849
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