يعرض 1 - 10 نتائج من 3,561 نتيجة بحث عن '"POLY-SI"', وقت الاستعلام: 1.89s تنقيح النتائج
  1. 1
    دورية أكاديمية
    One-Transistor Poly-Si Memory Devices With Near-Zero Subthreshold Swing and Extended Retention Time

    المؤلفون: Kuo, P.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(6):1008-1011 Jun, 2024

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  2. 2
    مؤتمر
    Modeling and Demonstration for Multi-level Weight Conductance in Computational FeFET Memory Cell

    المؤلفون: Koo, Won-Tae, Lee, Jae-Gil, Lee, Gunhee, Lee, Woocheol, Woo, Jungwook, Suh, Dong Ik, Kim, Joongsik, Lee, Hyung Dong, Lee, Seho, Yi, Jaeyun, Cha, Seon Yong

    المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024

    Relation: 2024 IEEE International Memory Workshop (IMW)

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  3. 3
    دورية أكاديمية
    Roles of Trap States in the Dynamic Degradation of Polycrystalline Silicon Thin-Film Transistors Under AC Gate Bias Stress

    المؤلفون: Zhang, B., Zhang, D., Wang, M., Wang, H., Wang, R.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(1):588-594 Jan, 2024

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  4. 4
    مؤتمر
    Dynamic Hot Carrier Degradation Behavior of Polycrystalline Silicon Thin-Film Transistors under Gate Voltage Pulse Stress with Fast Transition Time

    المؤلفون: Zhang, Meng, Wang, Yunyang, Jiang, Zhendong, Xu, Xindi, Huang, Jinyang, Wong, Man, Kwok, Hoi-Sing

    المصدر: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-5 Jul, 2023

    Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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  5. 5
    مؤتمر
    Residual Stress Analysis of Thin Film Materials for Fabricating Suspended Low Stress Si3N4 Waveguides on Sapphire

    المؤلفون: Berenschot, Erwin, Martinussen, Simen, Wang, Kai, Garcia-Blanco, Sonia, Tas, Niels, Tiggelaar, Roald

    المصدر: 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers) Solid-State Sensors, Actuators and Microsystems (Transducers), 2023 22nd International Conference on. :2086-2089 Jun, 2023

    Relation: 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)

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  6. 6
    مؤتمر
    Integration of (Poly-Silicon/Air)n Distributed Bragg Reflectors in a 150 mm Bulk Micromachined Wafer-Level MOEMS Fabrication Process for The Usage in IR-Spectrometry

    المؤلفون: Helke, Christian, Seiler, Jan, Meinig, Marco, Grosmann, Toni, Werner, Thomas, Bonitz, Jens, Haase, Micha, Zimmernann, Sven, Ebermann, Martin, Kurth, Steffen, Reuter, Danny, Hiller, Karla

    المصدر: 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers) Solid-State Sensors, Actuators and Microsystems (Transducers), 2023 22nd International Conference on. :1469-1472 Jun, 2023

    Relation: 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)

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  7. 7
    دورية أكاديمية
    Theory and Design of Novel Power Poly-Si/SiC Heterojunction Tunneling Transistor Structure

    المؤلفون: Fu, H., Wei, J., Wei, Z., Li, S., Zhang, L., Bai, S., Huang, R., Yang, X., Liu, S., Sun, W.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(11):6086-6092 Nov, 2023

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  8. 8
    دورية أكاديمية
    A Compact DC–DC Converter Using Low-Temperature Poly-Si Oxide Thin-Film Transistors

    المؤلفون: Priyadarshi, S., Rahaman, A., Billah, M.M., Nahar, S., Jang, J.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(10):1640-1643 Oct, 2023

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  9. 9
    دورية أكاديمية
    Accurate SPICE Model for Cells With Tube-Type Poly-Si Channel in Cell Strings of Vertical NAND Flash Memory

    المؤلفون: Hwang, J., Yoo, H., Lee, K., Back, J., Park, M., Yang, Y., Choi, W.Y., Lee, J.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(10):5469-5474 Oct, 2023

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  10. 10
    دورية أكاديمية
    Micro-LED Pixel Circuit Using Low-Temperature Poly-Si Oxide TFTs With Fast Rise and Fall Times of Pulse Width Modulation for Low Gray Expression

    المؤلفون: Kim, J., Lee, H., Jeong, M., Bae, J., Park, C., Jang, J.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(9):1448-1451 Sep, 2023

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