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المؤلفون: Davor Peruško, Nenad Bundaleski, Borivoje Adnadjevic, Biljana M. Gaković, Zlatko Rakočević, Nada Popovic, Milan Radovic, M Suzana Petrovic
المصدر: Journal of the Serbian Chemical Society
Journal of the Serbian Chemical Society, Vol 71, Iss 8-9, Pp 969-976 (2006)مصطلحات موضوعية: Materials science, Analytical chemistry, 02 engineering and technology, Substrate (electronics), x-ray diffraction (xrd), X-ray diffraction (XRD), law.invention, PVD W-Ti thin film, lcsh:Chemistry, low energy ions scattering (LEIS), Sputtering, law, Phase (matter), Surface roughness, Thin film, low energy ions scattering (leis), 020502 materials, General Chemistry, pvdw-ti thin film, 021001 nanoscience & nanotechnology, scanning tunnelling microscopy (STM), Grain size, 0205 materials engineering, lcsh:QD1-999, scanning tunneling microscopy (stm), Crystallite, Scanning tunneling microscope, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e3af90e2b3c9e01cbeaff838874f322
http://vinar.vin.bg.ac.rs/handle/123456789/3123 -
2دورية أكاديمية
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3مورد إلكتروني
المصدر: Journal of the Serbian Chemical Society
مصطلحات الفهرس: PVD W-Ti thin film, scanning tunnelling microscopy (STM), low energy ions scattering (LEIS), X-ray diffraction (XRD), article
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4مورد إلكتروني
المصدر: Journal of the Serbian Chemical Society
مصطلحات الفهرس: PVD W-Ti thin film, scanning tunnelling microscopy (STM), low energy ions scattering (LEIS), X-ray diffraction (XRD), article