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1مؤتمر
المؤلفون: Mozaffari, Seyed Nima, Bhaskaran, Bonita, Narayanun, Kaushik, Abdollahian, Ayub, Pagalone, Vinod, Sarangi, Shantanu, Colburn, Jonathon E.
المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-10 Nov, 2019
Relation: 2019 IEEE International Test Conference (ITC)
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2مؤتمر
المؤلفون: Li, Zipeng, Colburn, Jonathon E., Pagalone, Vinod, Narayanun, Kaushik, Chakrabarty, Krishnendu
المصدر: 2017 IEEE 35th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2017 IEEE 35th. :1-6 Apr, 2017
Relation: 2017 IEEE 35th VLSI Test Symposium (VTS)