المؤلفون: Manzoor, W., Dutta, A.K., Pahwa, G., Manzoor, N., Hu, C., Singh Chauhan, Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4510-4516 Aug, 2024

المؤلفون: Pahwa, G., Salahuddin, S., Hu, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4701-4709 Aug, 2024

المؤلفون: Sharma, A., Hayat Zarkob, Y., Pahwa, G., Kumar Dabhi, C., Goel, R., Agarwal, H., Kubrak, V., Tang, M., Treiber, M., Hu, C., Singh Chauhan, Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4240-4246 Jul, 2024

المؤلفون: Chang, Richard, Jie, Wang, Thakur, Namrata, Zhao, Ziyuan, Pahwa, Ramanpreet Singh, Yang, Xulei

المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :1872-1879 May, 2024

Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

المؤلفون: Parihar, Shivendra Singh, Pahwa, Girish, Chauhan, Yogesh S., Amrouch, Hussam

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Sainz, Oscar, García-Ferrero, Iker, Jacovi, Alon, Campos, Jon Ander, Elazar, Yanai, Agirre, Eneko, Goldberg, Yoav, Chen, Wei-Lin, Chim, Jenny, Choshen, Leshem, D'Amico-Wong, Luca, Dell, Melissa, Fan, Run-Ze, Golchin, Shahriar, Li, Yucheng, Liu, Pengfei, Pahwa, Bhavish, Prabhu, Ameya, Sharma, Suryansh, Silcock, Emily, Solonko, Kateryna, Stap, David, Surdeanu, Mihai, Tseng, Yu-Min, Udandarao, Vishaal, Wang, Zengzhi, Xu, Ruijie, Yang, Jinglin

مصطلحات موضوعية: Computer Science - Computation and Language, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2407.21530

المؤلفون: Singhal, A., Pahwa, G., Agarwal, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):3307-3314 May, 2024

المؤلفون: Dabhi, C.K., Rajasekharan, D., Pahwa, G., Nandi, D., Karumuri, N., Turuvekere, S., Dutta, A., Swaminathan, B., Srihari, S., Chauhan, Y.S., Salahuddin, S., Hu, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2284-2292 Apr, 2024

المؤلفون: Dabhi, C.K., Nandi, D., Nandan, K., Rajasekharan, D., Pahwa, G., Karumuri, N., Turuvekere, S., Dutta, A., Swaminathan, B., Srihari, S., Chauhan, Y.S., Salahuddin, S., Hu, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2293-2300 Apr, 2024

المؤلفون: Pahwa, Seema, Kaur, Amandeep

المصدر: 2024 11th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO), 2024 11th International Conference on. :1-5 Mar, 2024

Relation: 2024 11th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)